TY  - JOUR
A1  - Staat, Manfred
A1  - Heitzer, M.
T1  - Limit and Shakedown Analysis for Plastic Safety of Complex Structures
JF  - Transactions of the 14th International Conference on Structural Dynamics in Reactor Technology (SMiRT-14) / Livolant, M. [ed]
Y1  - 1997
N1  - Vol. B, Paper B02/2
SP  - 33
EP  - 40
CY  - Lyon
ER  - 
TY  - THES
A1  - Tran, Thanh Ngoc
T1  - Limit and shakedown analysis of plates and shells including uncertainties
Y1  - 2008
N1  - Chemnitz, Techn. Univ., Diss., 2008
ER  - 
TY  - CHAP
A1  - Tran, Ngoc Trinh
A1  - Trinh, Tu Luc
A1  - Dao, Ngoc Tien
A1  - Giap, Van Tan
A1  - Truong, Manh Khuyen
A1  - Dinh, Thuy Ha
A1  - Staat, Manfred
T1  - Limit and shakedown analysis of structures under random strength
T2  - Proceedings of (NACOME2022) The 11th National Conference on Mechanics, Vol. 1. Solid Mechanics, Rock Mechanics, Artificial Intelligence, Teaching and Training, Hanoi, December 2-3, 2022
N2  - Direct methods comprising limit and shakedown analysis is a branch of computational mechanics. It plays a significant role in mechanical and civil engineering design. The concept of direct method aims to determinate the ultimate load bearing capacity of structures beyond the elastic range. For practical problems, the direct methods lead to nonlinear convex optimization problems with a large number of variables and onstraints. If strength and loading are random quantities, the problem of shakedown analysis is considered as stochastic programming. This paper presents a method so called chance constrained programming, an effective method of stochastic programming, to solve shakedown analysis problem under random condition of strength. In this our investigation, the loading is deterministic, the strength is distributed as normal or lognormal variables.
KW  - Reliability of structures
KW  - Stochastic programming
KW  - Chance constrained programming
KW  - Shakedown analysis
KW  - Limit analysis
Y1  - 2022
SN  - 978-604-357-084-7
SP  - 510
EP  - 518
PB  - Nha xuat ban Khoa hoc tu nhien va Cong nghe (Verlag Naturwissenschaft und Technik)
CY  - Hanoi
ER  - 
TY  - THES
A1  - Tran, Ngoc Trinh
T1  - Limit and Shakedown analysis of structures under stochastic conditions
Y1  - 2019
U6  - http://dx.doi.org/10.24355/dbbs.084-201902121135-0
PB  - Technische Universität Braunschweig
CY  - Braunschweig
ER  - 
TY  - JOUR
A1  - Staat, Manfred
T1  - Limit and shakedown analysis under uncertainty
JF  - International journal of computational methods : IJCM
Y1  - 2013
SN  - 0219-8762
SP  - Publ. online
PB  - World Scientific Publishing
CY  - Singapore
ER  - 
TY  - JOUR
A1  - Staat, Manfred
T1  - Limit and shakedown analysis under uncertainty
JF  - Tap chi Khoa hoc & ung dung - Dai hoc Ton Duc Thang
Y1  - 2012
N1  - = Journal of Applied Sciences - Ton Duc Thang University
VL  - 19
SP  - 45
EP  - 47
ER  - 
TY  - JOUR
A1  - Staat, Manfred
A1  - Heitzer, M.
T1  - Limit and Shakedown Analysis with Uncertain Data
JF  - Stochastic optimization techniques : numerical methods and technical applications / Marti, K. [ed]
Y1  - 2002
SN  - 3-540-42889-5
SP  - 241
EP  - 254
PB  - Springer
CY  - Heidelberg
ER  - 
TY  - JOUR
A1  - Staat, Manfred
A1  - Vu, Khoi Duc
T1  - Limit loads of circumferentially flawed pipes and cylindrical vessels under internal pressure
JF  - International Journal of Pressure Vessels and Piping. 83 (2006), H. 3
Y1  - 2006
SN  - 0308-0161
SP  - 188
EP  - 196
ER  - 
TY  - JOUR
A1  - Fink, G. R.
A1  - Marshall, J. C.
A1  - Shah, N. J.
A1  - Weiss, P.H.
A1  - Halligan, P. W.
A1  - Grosse-Ruyken, M.
A1  - Ziemons, Karl
A1  - Zilles, K.
A1  - Freund, H. J.
T1  - Line bisection judgments implicate right parietal cortex and cerebellum as assessed by fMRI
JF  - Neurology
Y1  - 2000
SN  - 1526-632X
VL  - 54
IS  - 6
SP  - 1324
EP  - 1331
ER  - 
TY  - JOUR
A1  - Schäfer, Horst
A1  - Worschech, L.
A1  - Fischer, C.
A1  - Schenk, H. (u.a.)
T1  - Linearly Polarized Luminescence associated with Structural Defects in MBE grown ZnSe
JF  - Blue laser and light emitting diodes : [International Symposium on Blue Laser and Light Emitting Diodes (ISBLLED), Chiba, Japan , March 5 - 7, 1996] / ed. by A. Yoshikawa
Y1  - 1996
SN  - 4-274-90096-7
SP  - 421
EP  - 424
PB  - Ohmsha [u.a.]
CY  - Tokyo
ER  -