TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2
Y1  - 1993
SN  - 0018-9456
SP  - 528
EP  - 531
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.
Y1  - 1995
N1  - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference;  NTC <1995, Orlando, Fla.>
SP  - 129
EP  - 132
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Praezise Streuparametermessungen sind der Schluessel zur Modellierung elektrischer Schaltungen
JF  - Neues von Rohde & Schwarz (1997)
Y1  - 1997
SP  - 22
EP  - 23
ER  - 
TY  - BOOK
A1  - Heuermann, Holger
T1  - Sichere Verfahren zur Kalibrierung von Netzwerkanalysatoren fuer koaxiale und planare Leitungssysteme
Y1  - 1996
SN  - 3-8265-1495-5
N1  - Zugl.: Bochum, Univ., Diss., 1995
PB  - Shaker
CY  - Aachen
ER  - 
TY  - BOOK
A1  - Heuermann, Holger
T1  - Hochfrequenztechnik : Lineare Komponenten hochintegrierter Hochfrequenzschaltungen
Y1  - 2005
SN  - 3-528-03980-9
PB  - Vieweg
CY  - Wiesbaden
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1
Y1  - 1994
SN  - 0018-9456
SP  - 18
EP  - 23
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1120
EP  - 1127
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - 15-term self-calibration methods for the error-correction of on-wafer measurements
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1105
EP  - 1110
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Line Network Network (LNN): an alternative in-fixture calibration procedure
JF  - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3
Y1  - 1997
SN  - 0018-9480
SP  - 408
EP  - 413
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Calibration procedures with series impedances and unknown lines simplify on-wafer measurements
JF  - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1
Y1  - 1999
SN  - 0018-9480
SP  - 1
EP  - 5
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Calibration of network analyser measurements with leakage errors
JF  - Electronics letters. 30 (1994), H. 1
Y1  - 1994
SN  - 0013-5194
SP  - 52
EP  - 53
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Leerläufe als postulierte Kalibrierstandards fuer Messungen auf planaren Schaltungen
JF  - tm - Technisches Messen. 64. 1997 (1997), H. 6
Y1  - 1997
SP  - 230
EP  - 237
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Auswertemethoden zur Praezisions-Entfernungsmessung mit FMCW-Systemen und deren Anwendung im Mikrowellenbereich
JF  - tm - Technisches Messen. 62. 1995 (1995), H. 2
Y1  - 1995
SP  - 66
EP  - 73
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Robuster Algorithmus zur Streuparameterbestimmung für systemfehlerkorrigierte Netzwerkanalysatoren
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 35. 1991 (1991)
Y1  - 1991
SP  - 555
EP  - 556
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - LNN (Line-Network-Network): Verfahren zur Kalibrierung von Netzwerkanalysatoren
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 36. 1992 (1992)
Y1  - 1992
SP  - 327
EP  - 335
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Neue Kalibrierverfahren fuer on-wafer-Messungen
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 37. 1993 (1993)
Y1  - 1993
SP  - 195
EP  - 204
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Sichere on-wafer-Streuparameter-Messungen mit Selbstkalibrierverfahren
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 38. 1994 (1994)
Y1  - 1994
SP  - 611
EP  - 622
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Graf, W.
T1  - Vergleich mehrerer Naeherungsverfahren zur Berechnung des Wellenwiderstandes von Mikrostreifenleitungen mit experimentellen Ergebnissen
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 39. 1996 (1996)
Y1  - 1996
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Graf, W.
T1  - Direkte Messung der Dispersion des Wellenwiderstandes einer Mikrostreifenleitung
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 40. 1997 (1997)
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Graf, W.
T1  - Direkte on-wafer-Messung des Wellenwiderstandes einer Mikrostreifenleitung
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 41. 1998 (1998)
Y1  - 1998
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Neuartige Algorithmen fuer die Mikrowellen-Entfernungsmessung
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 38. 1995 (1995)
Y1  - 1995
SP  - 817
EP  - 834
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Selbstkalibrierverfahren zur Systemfehlerkorrektur von Streuparametermessungen auf Halbleitersubstraten
JF  - Mikrowellen und Optronik : Kongreßunterlagen = Microwaves and optronics / MIOP '95, 8. Kongreßmesse für Hochfrequenztechnik, Messehalle Sindelfingen, 30. Mai - 1. Juni 1995. [Hrsg.: Network GmbH]
Y1  - 1995
SN  - 3-924651-45-0
N1  - MIOP ; (8, 1995, Sindelfingen)
SP  - 23
EP  - 29
CY  - Hagenburg
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - LNN( Line-Network-Network): The In-Fixture Calibration Procedure
Y1  - 1993
N1  - XXIVth General Assembly of the International URSI, Kyoto
SP  - 149
EP  - 149
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration
Y1  - 1992
N1  - Precision electromagnetic measurements : conference Paris, 9-12 June 1992 = Conférence sur les Mesures Electromagnétiques de Précision.
SP  - 373
EP  - 374
CY  - Paris
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Error Corrected Impedance Measurements with a Network Analyzer
Y1  - 1994
N1  - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese
SP  - 125
EP  - 126
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Generalization of the Txx Network Analyzer Self-Calibration Procedure
JF  - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2
Y1  - 1992
SN  - 0-946821-77-1
N1  - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu <Helsinki>
SP  - 907
EP  - 912
PB  - Microwave Exhibitions and Publishers
CY  - Tunbridge Wells
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The In-Fixture Calibration Procedure Line-Network-Network-LNN
JF  - Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]
Y1  - 1992
SN  - 0-946821-23-2
N1  - European Microwave Conference <23, 1993, Madrid>
SP  - 500
EP  - 505
PB  - Reed Exhibition Companies
CY  - Tunbridge Wells
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
JF  - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994]
Y1  - 1994
SN  - 0-9518032-5-5
N1  - European Microwave Conference <24, 1994, Cannes>
PB  - Nexus Business Communications
CY  - Swanley
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Y1  - 1995
N1  - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
SP  - 129
EP  - 136
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures
Y1  - 1996
N1  - 46th ARFTG conference digest : November 30 - December 1. 1995, Safari Resort, Scottsdale, Arizona / Automatic RF Techniques Group. [Publ. chairman: Ed. Godshalk]
SP  - 136
EP  - 145
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Microwave On-Wafer Measurements with Activ Needle Probe Tips
Y1  - 1997
N1  - 47th ARFTG Conference digest : June 20 - 21, 1996, Moscone Convention Center, San Francisco, California / Automatic RF Techniques Group. [Publication chair: Ed Godshalk
SP  - 208
EP  - 214
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
Y1  - 1994
N1  - 1994 IEEE MTT-S International Microwave Symposium digest : May 23 - 27, 1994, San Diego Convention Center, San Diego, California / H. J. Kuno, ed.
SP  - 1361
EP  - 1364
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Baumann, F.-M.
A1  - Fauth, G.
A1  - Albert, M.
T1  - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
JF  - On-Line Moisture Analysis of Raw Coal
Y1  - 1994
N1  - 1993 International Symposium on On-Line Analysis of Coal : Vienna ; [proceedings].
SP  - 1361
EP  - 1364
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Rumiantsev, A.
A1  - Schott, S.
T1  - Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization
JF  - On wafer characterization : 63rd ARFTG conference digest, spring 2004, 11 June 2004, Fort Worth, TX / Automatic RF Techniques Group. [Conference chair: John Cable. Publication chair: J. G. Burns]
Y1  - 2004
SN  - 0-7803-8371-0
N1  - Microwave Theory and Techniques Society. ; Automatic RF Techniques Group ; ARFTG conference ; (63 : ; 2004.06.11 : ; Fort Worth, Tex.)
SP  - 91
EP  - 96
PB  - IEEE Operations Center
CY  - Piscataway, NJ
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - GSOLT: the calibration procedure for all multi-port vector network analyzers
JF  - IEEE MTT-S International Microwave Symposium digest : Philadelphia, Pennsylvania, 8 - 13 June 2003 ; [including: 2003 International Microwave Symposium digest, vol. 1-3, RF Integrated Circuit Symposium digest, Automatic RF Techniques Group Symposium digest . Vol. 3
Y1  - 2003
SN  - 0-780-37696-X
N1  - Nebent.: 2003 IEEE MTT-S International Microwave Symposium
SP  - 1815
EP  - 1818
PB  - IEEE
CY  - Piscataway, NJ
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
T1  - Novel balanced inductor for compact differential systems / Sadeghfam, Arash; Heuermann, Holger
JF  - Conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, [RAI International Exhibition and Congress Centre, Amsterdam ; part of European Microwave Week 2004] / EuMA, European Microwave Association
Y1  - 2004
SN  - 1-580-53992-0
N1  - European Microwave Conference ; (34, 2004, Amsterdam) ; European Microwave Week ; (7, 2004, Amsterdam)
SP  - 709
EP  - 712
PB  - Horizon House Publ.
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Erkens, Holger
T1  - Blocking structures for mixed-mode systems. / Erkens, Holger ; Heuermann, Holger
JF  - Conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, [RAI International Exhibition and Congress Centre, Amsterdam ; part of European Microwave Week 2004] / EuMA, European Microwave Association. Vol. 1
Y1  - 2004
SN  - 1-580-53992-0
N1  - European Microwave Conference ; (34, 2004, Amsterdam) ; European Microwave Week ; (7, 2004, Amsterdam)
SP  - 297
EP  - 300
PB  - Horizon House Publ.
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - A Synthesis Technique for Mono- and Mixed-Mode Symmetrical Filter
JF  - Conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, [RAI International Exhibition and Congress Centre, Amsterdam ; part of European Microwave Week 2004] / EuMA, European Microwave Association . Vol. 1
Y1  - 2004
SN  - 1-580-53992-0
N1  - European Microwave Conference ; (34, 2004, Amsterdam) ; European Microwave Week ; (7, 2004, Amsterdam)
SP  - 309
EP  - 312
PB  - Horizon House Publ
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Erkens, H.
T1  - EVM- und BER-optimierter differentieller Einseitenbandmodulator / Erkens, H., Heuermann, H.
JF  - German Microwave Conference - GeMiC 2005 - : conference proceedings ; University of Ulm, April 5 - 7, 2005 [Elektronische Ressource] / ed.: Wolfgang Menzel. IMA, VDE ...
Y1  - 2005
SN  - 3-00-015423-X
N1  - German Microwave Conference <2005, Ulm>
PB  - Univ
CY  - Ulm
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Lünebach, M.
T1  - A Novel Dual-Mode-Design for Push-Push Oscillators with Improved Phase Noise Performance. Heuermann, Holger; Lünebach, M.
JF  - Conference proceedings : 3 - 7 October 2005, CNIT la Défense, Paris, France; [comprises the] 35th European Microwave Conference 2005 ; The European Conference on Wireless Technology 2005 ; European Radar Conference 2005 ; GAAS 2005, The European Gallium A. Vol. 1
Y1  - 2005
SN  - 2-9600551-0-1
N1  - European Microwave Conference ; (35, 2005, Paris) ; European Microwave Week ; (2005, Paris)
SP  - 4 pp.
PB  - Horizon House Publ
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
A1  - Boehm, H.
T1  - Ultra Compact Multi-Mode Filter with Novel Rat-Race Inductor. Sadeghfam, Arash; Heuermann, Holger; Boehm, H.
JF  - Conference proceedings : 3 - 7 October 2005, CNIT la Défense, Paris, France; [comprises the] 35th European Microwave Conference 2005 ; The European Conference on Wireless Technology 2005 ; European Radar Conference 2005 ; GAAS 2005, The European Gallium A. Vol. 2
Y1  - 2005
SN  - 2-9600551-0-1
N1  - European Microwave Conference ; (35, 2005, Paris) ; European Microwave Week ; (2005, Paris)
SP  - 4 pp.
PB  - Horizon House Publ
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Verringerung des Phasenrauschens von Oszillatoren durch Dual-Mode-Resonatoren
JF  - HF-Report. 20 (2006), H. 5-6
Y1  - 2006
SN  - 1431-827X
SP  - 43
EP  - 48
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Peters, N.
A1  - Schmitz, T.
A1  - Sadeghfam, Arash
T1  - Concept of Balanced Antennas with Load-Invariant Base Impedance Using a Two Element LC-Coupler. Peters, N., Schmitz, Th., Sadeghfam, A., Heuermann, H.
JF  - Proceedings of the European microwave association : journal of the European microwave association
Y1  - 2005
SP  - 117
EP  - 122
PB  - PLUS
CY  - Pisa
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Erkens, H.
T1  - Novel RF switch concepts for differential wireless communications frontends. Erkens, H.; Heuermann, H.
JF  - IEEE Transactions on Microwave Theory and Techniques. 54 (2006), H. 6, Part 1
Y1  - 2006
SN  - 0018-9480
SP  - 2376
EP  - 2382
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Erkens, H.
T1  - Mixed-Mode Chain Scattering Parameters: Theory and Verification
JF  - IEEE Transactions on Microwave Theory and Techniques
N2  - Chain scattering parameters or T-parameters are a useful tool for calculating cascaded two-ports. With the increasing importance of mixed-mode S-parameters, a need for converting the T-parameters from their unbalanced form into a balanced form emerges for suiting both common and differential mode waves, as well as the mode conversion. This paper presents the derivation of the equations for transformations between mixed-mode S- and T-parameters for a mixed-mode two-port. Although derived in a way very similar to monomode T-parameters, no simplifications were necessary. Measurement results exemplify the quality of the T-parameter transformation under real-life conditions.
Y1  - 2007
SN  - 0018-9480
U6  - http://dx.doi.org/10.1109/TMTT.2007.902587
VL  - 55
IS  - 8
SP  - 1704
EP  - 1708
PB  - IEEE
CY  - New York
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
T1  - Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger
JF  - European Microwave Conference, 2008, EuMC 2008, 38th
Y1  - 2008
SN  - 978-2-87487-006-4
SP  - 1727
EP  - 1730
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Multiport S-parameter calculation from two-port network analyzer measurements with or without switch matrix
JF  - ARFTG Conference, 2006 67th, San Francisco, CA
Y1  - 2006
SN  - 978-0-7803-9529-9
SP  - 219
EP  - 222
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
T1  - On the design of multimode integrated circuits in multilayered processes / Sadeghfam, A. ; Heuermann, H.
JF  - European Microwave Conference, 2007, 9-12 Oct. 2007
Y1  - 2007
SN  - 978-2-87487-001-9
N1  - EuMC 2007 ; European Microwave Conference ; (37 : ; 2007.10.09-12 : ; Munich)
SP  - 516
EP  - 519
ER  -