TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2 Y1 - 1993 SN - 0018-9456 SP - 528 EP - 531 ER - TY - JOUR A1 - Heuermann, Holger A1 - Stolle, Reinhard A1 - Schiek, Burkhard T1 - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B. Y1 - 1995 N1 - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference; NTC <1995, Orlando, Fla.> SP - 129 EP - 132 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1 Y1 - 1994 SN - 0018-9456 SP - 18 EP - 23 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Error corrected impedance measurements with a network analyzer JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2 Y1 - 1995 SN - 0018-9456 SP - 295 EP - 299 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1120 EP - 1127 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - 15-term self-calibration methods for the error-correction of on-wafer measurements JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1105 EP - 1110 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Line Network Network (LNN): an alternative in-fixture calibration procedure JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3 Y1 - 1997 SN - 0018-9480 SP - 408 EP - 413 ER - TY - JOUR A1 - Heuermann, Holger T1 - Calibration procedures with series impedances and unknown lines simplify on-wafer measurements JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1 Y1 - 1999 SN - 0018-9480 SP - 1 EP - 5 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Calibration of network analyser measurements with leakage errors JF - Electronics letters. 30 (1994), H. 1 Y1 - 1994 SN - 0013-5194 SP - 52 EP - 53 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - LNN (Line-Network-Network): Verfahren zur Kalibrierung von Netzwerkanalysatoren JF - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 36. 1992 (1992) Y1 - 1992 SP - 327 EP - 335 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - LNN( Line-Network-Network): The In-Fixture Calibration Procedure Y1 - 1993 N1 - XXIVth General Assembly of the International URSI, Kyoto SP - 149 EP - 149 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration Y1 - 1992 N1 - Precision electromagnetic measurements : conference Paris, 9-12 June 1992 = Conférence sur les Mesures Electromagnétiques de Précision. SP - 373 EP - 374 CY - Paris ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Error Corrected Impedance Measurements with a Network Analyzer Y1 - 1994 N1 - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese SP - 125 EP - 126 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - A Generalization of the Txx Network Analyzer Self-Calibration Procedure JF - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2 Y1 - 1992 SN - 0-946821-77-1 N1 - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu SP - 907 EP - 912 PB - Microwave Exhibitions and Publishers CY - Tunbridge Wells ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - The In-Fixture Calibration Procedure Line-Network-Network-LNN JF - Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community] Y1 - 1992 SN - 0-946821-23-2 N1 - European Microwave Conference <23, 1993, Madrid> SP - 500 EP - 505 PB - Reed Exhibition Companies CY - Tunbridge Wells ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique JF - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994] Y1 - 1994 SN - 0-9518032-5-5 N1 - European Microwave Conference <24, 1994, Cannes> PB - Nexus Business Communications CY - Swanley ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices JF - Conference proceedings Y1 - 1995 N1 - European Microwave Conference <25, 1995, Bologna> SP - 343 EP - 347 PB - NEXUS House CY - Kent ER - TY - JOUR A1 - Heuermann, Holger T1 - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements Y1 - 1995 N1 - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk; ARFTG Conference digest ; 4 SP - 129 EP - 136 ER - TY - JOUR A1 - Heuermann, Holger T1 - Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures Y1 - 1996 N1 - 46th ARFTG conference digest : November 30 - December 1. 1995, Safari Resort, Scottsdale, Arizona / Automatic RF Techniques Group. [Publ. chairman: Ed. Godshalk] SP - 136 EP - 145 ER - TY - JOUR A1 - Heuermann, Holger T1 - Microwave On-Wafer Measurements with Activ Needle Probe Tips Y1 - 1997 N1 - 47th ARFTG Conference digest : June 20 - 21, 1996, Moscone Convention Center, San Francisco, California / Automatic RF Techniques Group. [Publication chair: Ed Godshalk SP - 208 EP - 214 ER -