TY  - JOUR
A1  - Schäfer, Horst
A1  - Boege, P.
A1  - Shanjia, Xu
A1  - Xinzhang, Wu (u.a.)
T1  - Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method
JF  - Conference digest : 10 - 14 January 1994, San Diego, California / International Conference on Millimeter and Submillimeter Waves and Applications / Mohammed N. Afsar, chair/ed.
Y1  - 1994
SN  - 0-8194-1558-8
N1  - Serie Proceedings / SPIE, The International Society for Optical Engineering ; 2250
SP  - 649
EP  - 658
PB  - SPIE
CY  - Bellingham, Wash.
ER  - 
TY  - JOUR
A1  - Schäfer, Horst
A1  - Shanjia, Xu
A1  - Xinzhang, Wu
A1  - Boege, P.
T1  - Scattering Characteristics of 3-D Discontinuity Consisting of Semiconductor Sample Filled in Waveguide with Gaps
JF  - International Journal of Infrared and Millimeter Waves. 14 (1993), H. 10
Y1  - 1993
SN  - 0195-9271
SP  - 2155
EP  - 2190
ER  -