TY  - JOUR
A1  - Miyamoto, Ko-ichiro
A1  - Bing, Yu
A1  - Wagner, Torsten
A1  - Yoshinobu, Tatsuo
A1  - Schöning, Michael Josef
T1  - Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor
JF  - Procedia Engineering
N2  - The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) inthe sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface.A reduced impedance inside the defect, which was artificially formed ina cell layer, was successfully visualized in a photocurrent image.
Y1  - 2015
U6  - http://dx.doi.org/10.1016/j.proeng.2015.08.806
SN  - 1877-7058
N1  - Part of special issue "Eurosensors 2015"
VL  - 120
SP  - 936
EP  - 939
PB  - Elsevier
CY  - Amsterdam
ER  - 
TY  - JOUR
A1  - Miyamoto, Ko-ichiro
A1  - Yu, Bing
A1  - Isoda, Hiroko
A1  - Wagner, Torsten
A1  - Schöning, Michael Josef
A1  - Yoshinobu, Tatsuo
T1  - Visualization of the recovery process of defects in a cultured cell layer by chemical imaging sensor
JF  - Sensors and Actuators B: Chemical
N2  - The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel cell assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the recovery of defects in a cell layer brought into proximity of the sensing surface. A reduced impedance at a defect formed artificially in a cell layer was successfully visualized in a photocurrent image. The cell layer was cultured over two weeks, during which the temporal change of the photocurrent distribution corresponding to the recovery of the defect was observed.
Y1  - 2016
U6  - http://dx.doi.org/10.1016/j.snb.2016.04.018
SN  - 0925-4005
VL  - 236
SP  - 965
EP  - 969
PB  - Elsevier
CY  - Amsterdam
ER  -