TY  - JOUR
A1  - Heuermann, Holger
A1  - Erkens, Holger
T1  - Blocking structures for mixed-mode systems. / Erkens, Holger ; Heuermann, Holger
JF  - Conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, [RAI International Exhibition and Congress Centre, Amsterdam ; part of European Microwave Week 2004] / EuMA, European Microwave Association. Vol. 1
Y1  - 2004
SN  - 1-580-53992-0
N1  - European Microwave Conference ; (34, 2004, Amsterdam) ; European Microwave Week ; (7, 2004, Amsterdam)
SP  - 297
EP  - 300
PB  - Horizon House Publ.
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2
Y1  - 1993
SN  - 0018-9456
SP  - 528
EP  - 531
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.
Y1  - 1995
N1  - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference;  NTC <1995, Orlando, Fla.>
SP  - 129
EP  - 132
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Praezise Streuparametermessungen sind der Schluessel zur Modellierung elektrischer Schaltungen
JF  - Neues von Rohde & Schwarz (1997)
Y1  - 1997
SP  - 22
EP  - 23
ER  - 
TY  - BOOK
A1  - Heuermann, Holger
T1  - Sichere Verfahren zur Kalibrierung von Netzwerkanalysatoren fuer koaxiale und planare Leitungssysteme
Y1  - 1996
SN  - 3-8265-1495-5
N1  - Zugl.: Bochum, Univ., Diss., 1995
PB  - Shaker
CY  - Aachen
ER  - 
TY  - BOOK
A1  - Heuermann, Holger
T1  - Hochfrequenztechnik : Lineare Komponenten hochintegrierter Hochfrequenzschaltungen
Y1  - 2005
SN  - 3-528-03980-9
PB  - Vieweg
CY  - Wiesbaden
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1
Y1  - 1994
SN  - 0018-9456
SP  - 18
EP  - 23
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1120
EP  - 1127
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - 15-term self-calibration methods for the error-correction of on-wafer measurements
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1105
EP  - 1110
ER  -