TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Schmidt, C.
A1  - Schubert, J.
A1  - Zander, W.
A1  - Mesters, S.
A1  - Kordos, P.
A1  - Lüth, H.
A1  - Legin, A.
A1  - Seleznev, B.
A1  - Vlasov, Y. G.
T1  - Thin film sensors on the basis of chalcogenide glass materials prepared by pulsed laser deposition technique
JF  - Sensors and Actuators B. 68 (2000), H. 1-3
Y1  - 2000
SN  - 0925-4005
SP  - 254
EP  - 259
ER  - 
TY  - JOUR
A1  - Schubert, J.
A1  - Schöning, Michael Josef
A1  - Schmidt, C.
A1  - Siegert, M.
A1  - Mesters, S.
A1  - Zander, W.
A1  - Kordos, P.
A1  - Lüth, H.
A1  - Legin, A.
A1  - Mourzina, Y. G.
A1  - Seleznev, B.
A1  - Vlasov, Y. G.
T1  - Chalcogenide-based thin film sensors prepared by pulsed laser deposition technique
JF  - Applied Physics A. 69, (1999), H. Supplement 1
Y1  - 1999
SN  - 0947-8396
U6  - http://dx.doi.org/10.1007/s003390051534
SP  - 803
EP  - 805
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Schmidt, C.
A1  - Schubert, J.
A1  - Zander, W.
A1  - Kordos, P.
A1  - Lüth, H.
A1  - Legin, A.
A1  - Seleznev, B.
A1  - Vlasov, Y. G.
T1  - Thin film sensors on the basis of chalcogenide glass materials prepared by pulsed laser deposition technique
JF  - Proceedings : The Hague, The Netherlands, September 12 - 15, 1999 / [ed. by M. Bartek]. Vol 1.
Y1  - 1999
SN  - 90-76699-02-X
N1  - Eurosensors ; (13, 1999, 's-Gravenhage) ; Eurosensors ; (13 : ; 1999.09.12-15 : ; The Hague) ; European Conference on Solid-State Transducers ; (13 : ; 1999.09.12-15 : ; The Hague)
SP  - 847
EP  - 850
CY  - The Hague, The Netherlands
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Schmidt, T.
A1  - Haug, R. J.
T1  - Single-electron transport in small resonant-tunneling diodes with various barrier-thickness asymmetries / T. Schmidt ; R. J. Haug ; K. v. Klitzing ; A. Förster ...
JF  - Physical review / B, Condensed matter and materials physics. 55 (1997), H. 4
Y1  - 1997
SN  - 1095-3795
SP  - 2230
EP  - 2236
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Schmidt, T.
A1  - Tewordt, M.
A1  - Haug, R. J.
T1  - Peak-to-valley ratio of small resonant-tunneling diodes with various barrier-thickness asymmetries / T. Schmidt ; M. Tewordt ; R. J. Haug ... A. Förster ...
JF  - Applied physics letters. 68 (1996), H. 6
Y1  - 1996
SN  - 0003-6951
N1  - ISSN der E-Ausg.: 1077-3118
SP  - 838
EP  - 840
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Schmidt, T.
A1  - Haug, R. J.
T1  - Imaging the local density of states in a disordered semiconductor / T. Schmidt ; R. J. Haug ; V. I. Fal'ko ... A. Förster ...
JF  - 23rd International Conference on the Physics of Semiconductors : Berlin, Germany, July 21 - 26, 1996 / ed.: Matthias Scheffler ... - Vol. 3
Y1  - 1996
SN  - 981-02-2947-X
N1  - International Conference on the Physics of Semiconductors <23, 1996, Berlin>
SP  - 2251
EP  - ff.
PB  - World Scientific
CY  - Singapore [u.a.]
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Schmidt, T.
A1  - Haug, R. J.
T1  - Spectroscopy of local density of states fluctuations in a disordered conductor / T. Schmidt ; R. J. Haug ; V. I. Fal'ko ... A. Förster ...
JF  - Europhysics letters. 36 (1996), H. 1
Y1  - 1996
SN  - 1286-4854
SP  - 61
EP  - 66
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Schmidt, T.
A1  - Haug, R. J.
T1  - Spectroscopy of the single-particle states of a quantum-dot molecule / T. Schmidt ; R. J. Haug ; K. v. Klitzing ; A. Förster ...
JF  - Physical review letters. 78 (1997), H. 8
Y1  - 1997
SN  - 0031-9007
N1  - ISSN der E-Ausg.: 1079-7114
SP  - 1544
EP  - 1547
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Schmidt, T.
A1  - Haug, R. J.
T1  - Observation of the local structure of landau bands in a disordered conductor / T. Schmidt ; R. J. Haug ; Vladimir I. Fal'ko ... A. Förster ...
JF  - Physical review letters. 78 (1997), H. 8
Y1  - 1997
SN  - 0031-9007
N1  - ISSN der E-Ausg.: 1079-7114
SP  - 1540
EP  - 1543
ER  - 
TY  - JOUR
A1  - Biselli, Manfred
A1  - Schmidt, S.
A1  - Büchs, J.
A1  - Born, C.
T1  - A new correlation for the wall-to-fluid mass transfer in liquid-sol fluidized beds / Schmidt, S. ; Büchs, J. ; Born, C. ; Biselli, M.
JF  - Chemical Engineering Science. 54 (1999), H. 6
Y1  - 1999
SN  - 0009-2509
SP  - 829
EP  - 839
ER  -