TY - CHAP A1 - Sildatke, Michael A1 - Karwanni, Hendrik A1 - Kraft, Bodo A1 - Schmidts, Oliver A1 - Zündorf, Albert T1 - Automated Software Quality Monitoring in Research Collaboration Projects T2 - ICSEW'20: Proceedings of the IEEE/ACM 42nd International Conference on Software Engineering Workshops N2 - In collaborative research projects, both researchers and practitioners work together solving business-critical challenges. These projects often deal with ETL processes, in which humans extract information from non-machine-readable documents by hand. AI-based machine learning models can help to solve this problem. Since machine learning approaches are not deterministic, their quality of output may decrease over time. This fact leads to an overall quality loss of the application which embeds machine learning models. Hence, the software qualities in development and production may differ. Machine learning models are black boxes. That makes practitioners skeptical and increases the inhibition threshold for early productive use of research prototypes. Continuous monitoring of software quality in production offers an early response capability on quality loss and encourages the use of machine learning approaches. Furthermore, experts have to ensure that they integrate possible new inputs into the model training as quickly as possible. In this paper, we introduce an architecture pattern with a reference implementation that extends the concept of Metrics Driven Research Collaboration with an automated software quality monitoring in productive use and a possibility to auto-generate new test data coming from processed documents in production. Through automated monitoring of the software quality and auto-generated test data, this approach ensures that the software quality meets and keeps requested thresholds in productive use, even during further continuous deployment and changing input data. Y1 - 2020 U6 - https://doi.org/10.1145/3387940.3391478 N1 - ICSE '20: 42nd International Conference on Software Engineering, Seoul, Republic of Korea, 27 June 2020 - 19 July 2020 SP - 603 EP - 610 PB - IEEE CY - New York, NY ER - TY - CHAP A1 - Schmidts, Oliver A1 - Kraft, Bodo A1 - Winkens, Marvin A1 - Zündorf, Albert T1 - Catalog integration of low-quality product data by attribute label ranking T2 - Proceedings of the 9th International Conference on Data Science, Technology and Applications DATA - Volume 1 N2 - The integration of product data from heterogeneous sources and manufacturers into a single catalog is often still a laborious, manual task. Especially small- and medium-sized enterprises face the challenge of timely integrating the data their business relies on to have an up-to-date product catalog, due to format specifications, low quality of data and the requirement of expert knowledge. Additionally, modern approaches to simplify catalog integration demand experience in machine learning, word vectorization, or semantic similarity that such enterprises do not have. Furthermore, most approaches struggle with low-quality data. We propose Attribute Label Ranking (ALR), an easy to understand and simple to adapt learning approach. ALR leverages a model trained on real-world integration data to identify the best possible schema mapping of previously unknown, proprietary, tabular format into a standardized catalog schema. Our approach predicts multiple labels for every attribute of an inpu t column. The whole column is taken into consideration to rank among these labels. We evaluate ALR regarding the correctness of predictions and compare the results on real-world data to state-of-the-art approaches. Additionally, we report findings during experiments and limitations of our approach. Y1 - 2020 SN - 978-989-758-440-4 U6 - https://doi.org/10.5220/0009831000900101 N1 - 9th International Conference on Data Science, Technologies and Applications (DATA 2020), 7 - 9 July 2020, online SP - 90 EP - 101 PB - SciTePress CY - Setúbal, Portugal ER -