TY  - JOUR
A1  - Tillmann, K.
A1  - Förster, Arnold
T1  - Critical dimensions for the formation of interfacial misfit dislocations of In0.6Ga0.4As islands on GaAs(001)
JF  - Thin Solid Films. 368 (2000), H. 1
Y1  - 2000
SN  - 0040-6090
SP  - 93
EP  - 104
ER  - 
TY  - JOUR
A1  - Vitusevich, S. A.
A1  - Förster, Arnold
A1  - Reetz, W.
A1  - Lüth, H.
A1  - Belyaev, A. E.
A1  - Danylyuk, S. V.
T1  - Spectral Responsivity of single-quantum-well photodetectors
JF  - Applied Physics Letters. 77 (2000), H. 1
Y1  - 2000
SN  - 1077-3118
SP  - 16
EP  - 18
ER  - 
TY  - JOUR
A1  - Vitusevich, S. A.
A1  - Förster, Arnold
A1  - Indlekofer, K.-M.
A1  - Lüth, H.
A1  - Belyaev, A. E.
A1  - Glavin, B. A.
A1  - Konakova, R. V.
T1  - Tunneling Through X-Valley-Related Impurity States in GaAs/AlAs Resonant-Tunneling Diodes
JF  - Physical  Review . B. 61 (2000), H. 16
Y1  - 2000
SN  - 1550-235X
SP  - 10898
EP  - 10904
ER  - 
TY  - JOUR
A1  - Förster, Arnold
A1  - Stock, J.
A1  - Indlekofer, K. M.
T1  - Perspectives of resonant tunneling diodes
JF  - Recent research developments in materials science & engineering/ 1,2
Y1  - 2002
SN  - 81-7895-057-X
N1  - Nebent.: Materials science & engineering
SP  - 527
EP  - 556
PB  - Transworld Research Network
CY  - Trivandrum, India
ER  - 
TY  - JOUR
A1  - Mikulics, M.
A1  - Marso, M.
A1  - Cámara Mayorga, I.
A1  - Gusten, R.
A1  - Stancek, S.
A1  - Michael, E. A.
A1  - Schieder, R.
A1  - Wolter, M.
A1  - Buca, D.
A1  - Förster, Arnold
A1  - Kordos, P.
A1  - Lüth, H.
T1  - Photomixers fabricated on nitrogen-ion-implanted GaAs
JF  - Applied physics letters. 87 (2005)
Y1  - 2005
SP  - 041106-1
EP  - 041106-3
ER  - 
TY  - JOUR
A1  - Maezawa, Koichi
A1  - Förster, Arnold
T1  - Quantum transport devices based on resonant tunneling
JF  - Nanoelectronics and information technology : advanced electronic materials and novel devices / Rainer Waser (ed.).
Y1  - 2003
SN  - 3-527-40363-9
SP  - 407
EP  - 424
PB  - Wiley-VCH
CY  - Weinheim
ER  - 
TY  - JOUR
A1  - Mikulics, M.
A1  - Camara, I.
A1  - Hardt, A. van der
A1  - Fox, A.
A1  - Förster, Arnold
A1  - Gusten, R.
A1  - Lüth, H.
A1  - Kordos, P.
T1  - Generation of THz radiation by photomixing in low-temperature-grown MBE GaAs
JF  - Fifth International Conference on Advanced Semiconductor Devices and Microsystems : conference proceedings ; Smolenice Castle, Slovakia, October 17 - 21, 2004 / [organizers: Institute of Electrical Engineering, Slovak Academy of Sciences, Bratislava and Microelectronics Department, Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava]. Ed. by J. Osvald
Y1  - 2004
SN  - 0-7803-8335-7
N1  - International Conference on Advanced Semiconductor Devices and Microsystems <5, 2004, Smolenice> ; ASDAM <5, 2004, Smolenice> ; IEEE catalog numer: 04EX867
SP  - 231
EP  - 234
PB  - IEEE Operations Center
CY  - Piscataway, NJ
ER  - 
TY  - JOUR
A1  - Zatko, B.
A1  - Dubecký, F.
A1  - Bohacek, P.
A1  - Gombia, E.
A1  - Frigeri, P.
A1  - Mosca, R.
A1  - Franchi, S.
A1  - Huarn, J.
A1  - Nescas, V.
A1  - Sekacova, M.
A1  - Förster, Arnold
A1  - Kordos, P.
T1  - On the spectrometric performance limit of radiation detectors based on semi-insulating GaAs
JF  - Nuclear instruments and methods in physics research, Section A. 531 (2004), H. 1-2
Y1  - 2004
SN  - 0168-9002
SP  - 111
EP  - 120
ER  - 
TY  - JOUR
A1  - Srnanek, R.
A1  - Geurts, J.
A1  - Lentze, M.
A1  - Irmer, G.
A1  - Donoval, D.
A1  - Brdecka, P.
A1  - Kordos, P.
A1  - Förster, Arnold
A1  - Sciana, B.
A1  - Radziewicz, D.
A1  - Tlaczala, M.
T1  - Study of d-doped GaAs layers by micro-Raman spectroscopy on bevelled samples
JF  - Applied surface science  . 230 (2004), H. 1 -4
Y1  - 2004
SN  - 0169-4332
N1  - ISSN der E-Ausg.: 0169-4332
SP  - 379
EP  - 385
ER  - 
TY  - JOUR
A1  - Mikulics, M.
A1  - Adam, R.
A1  - Kordos, P.
A1  - Förster, Arnold
A1  - Lüth, H.
A1  - Wu, S.
A1  - Zheng, X.
A1  - Sobolewski, R.
T1  - Ultrafast low-temperature-grown epitaxial GaAs photodetectors transferred on flexible plastic substrates
JF  - IEEE photonics technology letters : IEEE PTL. 17 (2005), H. 8
Y1  - 2005
SN  - 1041-1135
SP  - 1725
EP  - 1727
ER  -