TY  - JOUR
A1  - Staat, Manfred
T1  - Plastic collapse analysis of longitudinally flawed pipes and vessels
N2  - Improved collapse loads of thick-walled, crack containing pipes and vessels are suggested. Very deep cracks have a residual strength which is better modelled by a global limit load. In all burst tests, the ductility of pressure vessel steels was sufficiently high whereby the burst pressure could be predicted by limit analysis with no need to apply fracture mechanics. The relative prognosis error increases however, for long and deep defects due to uncertainties of geometry and strength data.
KW  - Druckbehälter
KW  - Stahl
KW  - Druckbelastung
KW  - Druckbeanspruchung
KW  - Rohr
KW  - Rohrbruch
KW  - Druckbehälter
KW  - Stahl
KW  - Druckbelastung
KW  - Druckbeanspruchung
KW  - Rohrbruch
KW  - Fehlerstellen
KW  - pipes
KW  - vessels
KW  - load limit
KW  - burst tests
KW  - burst pressure
KW  - flaw
Y1  - 2004
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Schubert, J
A1  - Kloock, Joachim P.
A1  - Zander, W.
A1  - Mourzina, Y. G.
A1  - Legin, A.
A1  - Vlasov, Y. G.
A1  - Lüth, H.
T1  - Innovative thin film techniques for microfabricating electrochemical sensors
JF  - Lecture Notes of the ICB Seminars
Y1  - 2002
SP  - 55
EP  - 66
PB  - MCB
CY  - Warsaw
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
T1  - Silicon-based biochemical sensors
JF  - CNI - The Center of Nanoelectronic Systems for Information Technology
Y1  - 2003
SP  - 165
EP  - 170
PB  - Foschungszentrum Jülich
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Lüth, H.
T1  - Microfabricated semiconductor structures – Advances in (bio-)chemical sensing
JF  - Coupling of biological and electronic systems : proceedings of the 2nd Caesarium, Bonn, November 1 - 3, 2000 / Karl-Heinz Hoffmann, ed.
Y1  - 2002
SN  - 3-540-43699-5
SP  - 79
EP  - 92
PB  - Springer
CY  - Berlin [u.a.]
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Schubert, Joachim P.
A1  - Kloock, Joachim P.
A1  - Zander, W.
A1  - Mourzina, Y. G.
A1  - Legin, A.
A1  - Vlasov, Y. G.
A1  - Lüth, H.
T1  - Innovative thin film techniques for microfabricating electrochemical sensors
JF  - Biocybernetics and Biomedical Engineering. 21 (2001), H. 4
Y1  - 2001
SN  - 0208-5216
SP  - 107
EP  - 119
ER  - 
TY  - JOUR
A1  - Schroth, P.
A1  - Weißbecker, B.
A1  - Schütz, S.
A1  - Ecken, H.
A1  - Yoshinobu, T.
A1  - Lüth, H.
A1  - Schöning, Michael Josef
T1  - Bioelectronic signal processing - intact chemoreceptors coupled to field-effect devices
JF  - Lecture Notes of the ICB Seminars
Y1  - 2002
SP  - 28
EP  - 42
PB  - MCB
CY  - Warsaw
ER  - 
TY  - JOUR
A1  - Schroth, P.
A1  - Weißbecker, B.
A1  - Schütz, S.
A1  - Ecken, H.
A1  - Yoshinobu, T.
A1  - Lüth, H.
A1  - Schöning, Michael Josef
T1  - Bioelectronic signal processing - intact chemoreceptors coupled to field-effect devices
JF  - Biocybernetics and Biomedical Engineering. 21 (2001), H. 3
Y1  - 2001
SN  - 0208-5216
SP  - 27
EP  - 42
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
T1  - Novel approaches to design siliconbased field-effect sensors
JF  - Electrochemical Microsystem Technologies, New Trends in Electrochemistry Vol. 2
Y1  - 2002
SP  - 384
EP  - 408
PB  - Taylor & Francis
CY  - London New York
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Lüth, H.
T1  - Novel concepts for silicon-based biosensors
JF  - Physica Status Solidi (A) (2001)
Y1  - 2001
SN  - 0031-8965
SP  - 65
EP  - 77
ER  - 
TY  - JOUR
A1  - Staat, Manfred
T1  - Direct FEM Limit and Shakedown Analysis with Uncertain Data
N2  - The structural reliability with respect to plastic collapse or to inadaptation is formulated on the basis of the lower bound limit and shakedown theorems. A direct definition of the limit state function is achieved which permits the use of the highly effective first order reliability methods (FORM) is achieved. The theorems are implemented into a general purpose FEM program in a way capable of large-scale analysis. The limit state function and its gradient are obtained from a mathematical optimization problem. This direct approach reduces considerably the necessary knowledge of uncertain technological input data, the computing time, and the numerical error, leading to highly effective and precise reliability analyses.
KW  - Finite-Elemente-Methode
KW  - Einspielen <Werkstoff>
KW  - FEM
KW  - Einspielanalyse
KW  - shakedown
KW  - limit load
KW  - reliability analysis
KW  - FEM
KW  - direct method
Y1  - 2000
ER  -