TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - LNN( Line-Network-Network): The In-Fixture Calibration Procedure
Y1  - 1993
N1  - XXIVth General Assembly of the International URSI, Kyoto
SP  - 149
EP  - 149
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration
Y1  - 1992
N1  - Precision electromagnetic measurements : conference Paris, 9-12 June 1992 = Conférence sur les Mesures Electromagnétiques de Précision.
SP  - 373
EP  - 374
CY  - Paris
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Error Corrected Impedance Measurements with a Network Analyzer
Y1  - 1994
N1  - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese
SP  - 125
EP  - 126
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Generalization of the Txx Network Analyzer Self-Calibration Procedure
JF  - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2
Y1  - 1992
SN  - 0-946821-77-1
N1  - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu <Helsinki>
SP  - 907
EP  - 912
PB  - Microwave Exhibitions and Publishers
CY  - Tunbridge Wells
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The In-Fixture Calibration Procedure Line-Network-Network-LNN
JF  - Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]
Y1  - 1992
SN  - 0-946821-23-2
N1  - European Microwave Conference <23, 1993, Madrid>
SP  - 500
EP  - 505
PB  - Reed Exhibition Companies
CY  - Tunbridge Wells
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
JF  - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994]
Y1  - 1994
SN  - 0-9518032-5-5
N1  - European Microwave Conference <24, 1994, Cannes>
PB  - Nexus Business Communications
CY  - Swanley
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Y1  - 1995
N1  - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
SP  - 129
EP  - 136
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures
Y1  - 1996
N1  - 46th ARFTG conference digest : November 30 - December 1. 1995, Safari Resort, Scottsdale, Arizona / Automatic RF Techniques Group. [Publ. chairman: Ed. Godshalk]
SP  - 136
EP  - 145
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Microwave On-Wafer Measurements with Activ Needle Probe Tips
Y1  - 1997
N1  - 47th ARFTG Conference digest : June 20 - 21, 1996, Moscone Convention Center, San Francisco, California / Automatic RF Techniques Group. [Publication chair: Ed Godshalk
SP  - 208
EP  - 214
ER  -