TY - CHAP A1 - Brüssermann, Klaus A1 - Deuster, M. T1 - Temperature measurement to optimise the burning process N2 - One of the most important parameters in a burning chamber - in power stations, in waste to energy plants - is the temperature. This temperature is in the range of 700-1500 °C - one of the most advanced measuring methods being the acoustic pyrometry with the possibility of producing temperature mapping in one level of the burning chamber - comparable to computer tomography. The results of these measurements discussed in the presentation can be used - to fulfil the legal requirements in the FRG or in the EU - to equalise the temperature in one level of the burning chamber to optimise the steam production (better efficiency of the plant) and to minimise the production of temperature controlled flue gas components (NO, CO a. o.) - to control the SNCR-process if used. KW - Pyrometrie KW - Temperaturmessung KW - temperature measurement KW - acoustic pyrometry KW - steam production KW - flue gas components Y1 - 2005 ER - TY - CHAP A1 - Brüssermann, Klaus T1 - Platform of Excellence in "Energy and Environment" N2 - The Ministry of Science and Research in North Rhine-Westphalia created eight platforms of excellence, one in the research area „Energy and Environment“ in 2002 at ACUAS. This platform concentrates the research and development of 13 professors in Jülich and Aachen and of two scientific institutes with different topics: – NOWUM-Energy with emphasis on efficient and economic energy conversion – The Solar Institute Jülich – SIJ – being the largest research institute in the field of renewables at a University of Applied Sciences in Germany With this platform each possible energy conversion – nuclear, fossil, renewable- can be dealt with to help solving the two most important problems of mankind, energy and potable water. At the CSE are presented the historical development, some research results and the combined master studies in „Energy Systems“ and „Nuclear Applications“ KW - Energietechnik KW - Kernenergie KW - Umwelt KW - Energy KW - environment KW - Energy Systems KW - Nuclear Applications Y1 - 2005 ER - TY - CHAP A1 - Kern, Alexander A1 - Dikta, Gerhard T1 - Probability of damage of electrical and electronic systems due to indirect lightning flashes - investigation of data from German insurance companies N2 - In the presented paper data collected from the field related to damage statistics of electrical and electronic apparatus in household are reported and investigated. These damages (total number approx. 74000 cases), registered by five German insurance companies in 2005 and 2006, were adviced by customers as caused by lightning overvoltages. With the use of stochastical methods it is possible, to reasses the collected data and to distinguish between cases, which are with high probability caused by lightning overvoltages, and those, which are not. If there was an indication for a direct strike, this case was excluded, so the focus was only on indirect lightning flashes, i.e. only flashes to ground near the structure and flashes to or nearby an incoming service line were investigated. The data from the field contain the location of damaged apparatus (residence of the policy holder) and the distances of the nearest cloud-to-ground stroke to the location of the damage registered by the German lightning location network BLIDS at the date of damage. The statistical data along with some complementary numerical simulations allow to verify the correspondence of the Standards rules used for IEC 62305-2 with the field data and to define some correction needs. The results could lead to a better understanding whether a damage reported to an insurance company is really caused by indirect lightning, or not. KW - Blitzschutz KW - lightning flash Y1 - 2009 ER - TY - JOUR A1 - Förster, Arnold A1 - Darmo, J. A1 - Dubecký, F. A1 - Kordos, P. T1 - Annealing characteristics of native defects in low-temperature-grown MBE GaAs / J. Darmo ; F. Dubecky ; P. Kordos ; A. Förster JF - Semiconducting and insulating materials 1996 : proceedings of the 9th Conference on Semiconducting and Insulating Materials (SIMC '9), April 29 - May 3, 1996, Toulouse, France / [IEEE] Y1 - 1996 SN - 0-7803-3095-1 N1 - 2. ISBN: 0-7803-3179-6 ; Conference on Semiconducting and Insulating Materials <9, 1996, Toulouse> ; Institute of Electrical and Electronics Engineers ; IEEE Cat. No.96CH35881 SP - 67 EP - ff. CY - Piscataway, NJ [u.a.] ER - TY - JOUR A1 - Tillmann, K. A1 - Förster, Arnold T1 - Critical dimensions for the formation of interfacial misfit dislocations of In0.6Ga0.4As islands on GaAs(001) JF - Thin Solid Films. 368 (2000), H. 1 Y1 - 2000 SN - 0040-6090 SP - 93 EP - 104 ER - TY - JOUR A1 - Vitusevich, S. A. A1 - Förster, Arnold A1 - Reetz, W. A1 - Lüth, H. A1 - Belyaev, A. E. A1 - Danylyuk, S. V. T1 - Spectral Responsivity of single-quantum-well photodetectors JF - Applied Physics Letters. 77 (2000), H. 1 Y1 - 2000 SN - 1077-3118 SP - 16 EP - 18 ER - TY - JOUR A1 - Förster, Arnold A1 - Rosenauer, A. A1 - Oberst, W. A1 - Gerthsen, D. T1 - Atomic scale analysis of the indium distribution in InGaAs/GaAs (001) heterostructures: segregation, lateral indium redistribution and the effect of growth interruptions. Rosenauer, A. ; Oberst, W. ; Gerthsen, D. ; Förster, A. JF - Thin Solid Films. 357 (1999) Y1 - 1999 SN - 0040-6090 SP - 18 EP - 21 ER - TY - JOUR A1 - Förster, Arnold A1 - Zamdmer, N. A1 - Hu, Qing A1 - Verghese, S. T1 - Mode-Discriminating Photoconductor and Coplanar Wave-Guide Circuits for Picosecond Sampling. Zamdmer, N.; Hu, Qing ; Verghese, S. ; Förster, A. JF - Applied Physics Letters. 74 (1999), H. 7 Y1 - 1999 SN - 1077-3118 SP - 1039 EP - 1041 ER - TY - JOUR A1 - Vitusevich, S. A. A1 - Förster, Arnold A1 - Indlekofer, K.-M. A1 - Lüth, H. A1 - Belyaev, A. E. A1 - Glavin, B. A. A1 - Konakova, R. V. T1 - Tunneling Through X-Valley-Related Impurity States in GaAs/AlAs Resonant-Tunneling Diodes JF - Physical Review . B. 61 (2000), H. 16 Y1 - 2000 SN - 1550-235X SP - 10898 EP - 10904 ER - TY - JOUR A1 - Förster, Arnold T1 - Layer Deposition I JF - Fundamentals of nanoelectronics / Stefan Blügel ... (ed.). - (Lecture manuscripts of the ... Spring School of the Department of Solid State Research ; 34). - (Schriften des Forschungszentrums Jülich : Materie und Material ; 14 ; 34) Y1 - 2003 SN - 3-89336-319-X SP - C2.1 EP - C2.13 PB - Forschungszentrum, Zentralbibliothek CY - Jülich ER -