TY  - CHAP
A1  - Pfaff, Raphael
A1  - Larkowski, Tomasz
A1  - Burnham, Keith J.
T1  - An approach to adaptive control in the behavioural framework
T2  - UKACC International Conference on Control 2010 (CONTROL 2010) : Coventry, United Kingdom, 7 - 10 September 2010 ; Vol. 2. (IET seminar digest ; 2010/004)
Y1  - 2010
SN  - 978-1-62748-119-9
SP  - 833
EP  - 838
PB  - Curran
CY  - Red Hook, NY
ER  - 
TY  - CHAP
A1  - Seiler, Friedrich
A1  - Pichler, Alexander
A1  - Pfaff, Raphael
A1  - George, Alfred
A1  - Srulijes, Julio
T1  - Improved Doppler picture velocimetry and new automated processing
T2  - 14th International Symposium on Applications of Laser Techniques to Fluid Mechanics : Lisbon, Portugal, 7 - 10 July 2008
Y1  - 2008
SP  - 1
EP  - 12
ER  - 
TY  - CHAP
A1  - Pfaff, Raphael
A1  - Pichler, Alexander
A1  - George, Alfred
A1  - Seiler, Friedrich
T1  - Model based image processing for flow visualisation : 16th International Conference on Systems Science, Wroclaw, Poland, September 04 - 06, 2007
T2  - PU / Institut Franco-Allemand de Recherches de Saint-Louis ; 2007, 620
Y1  - 2007
SP  - 1
EP  - 10
PB  - ISL
CY  - Saint Louis, France
ER  - 
TY  - CHAP
A1  - Pfaff, Raphael
A1  - Burnham, Keith J.
T1  - On abstraction and interpretability: a behavioural perspective
T2  - 19th International Conference on Systems Engineering 2008 : ICSENG '08 : 19 - 21 Aug. 2008, University of Nevada, Las Vegas, Nevada
Y1  - 2008
SN  - 978-0-7695-3331-5 ; 978-0-7695-2719-2
SP  - 89
EP  - 94
PB  - IEEE
CY  - Piscataway, NJ
ER  - 
TY  - CHAP
A1  - Rousseau, Alain
A1  - Kern, Alexander
T1  - How to deal with environmental risk in IEC 62305-2
T2  - 2014 International Conference on Lightning Protection (ICLP), Shanghai, China
N2  - The 2nd edition of the lightning risk management
standard (IEC 62305-2) considers structures, which may
endanger environment. In these cases, the loss is not limited to
the structure itself, which is valid for usual structures. In the past
(Edition 1) this danger was simply taken into account by a special
hazard factor, multiplying the existing risk for the structure with
a number. Now, in the edition 2, we add to the risk for the
structure itself a “second risk” due to the losses outside the
structure. The losses outside can be treated independently from
what occurs inside. This is a major advantage to analyze the risk
for sensitive structures, like chemical plants, nuclear plants, or
structures containing explosives, etc. In this paper, the existing
procedure given by the European version EN 62305-2 Ed.2 is
further developed and applied to a few structures.
Y1  - 2014
SP  - 521
EP  - 527
ER  - 
TY  - CHAP
A1  - Kern, Alexander
A1  - Braun, Christian
T1  - Risk management according to IEC 62305-2 edition 2: 2010–12 assessment of structures with a risk of explosion
T2  - 2014 International Conference on Lightning Protection (ICLP), Shanghai, China
N2  - Risk management for structures with a risk of explosion should be considered very carefully when performing a risk analysis according to IEC 62305-2. In contrast to the 2006 edition of the standard, the 2010 edition describes the topic “Structures with a risk of explosion” in more detail. Moreover, in Germany separate procedures and parameters are defined for the risk analysis of structures with a risk of explosion (Supplement 3 of the German DIN EN 62305-2 standard). This paper describes the contents and the relevant calculations of this Supplement 3, together with a numerical example.
Y1  - 2014
SP  - 1237
EP  - 1242
ER  - 
TY  - CHAP
A1  - Kloock, Joachim P.
A1  - Schöning, Michael Josef
T1  - Heavy metal detection with semiconductor devices based on PLD-prepared chalcogenide glass thin films
T2  - Armenian Journal of Physics
Y1  - 2007
SN  - 1829-1171
SP  - 95
EP  - 98
ER  - 
TY  - CHAP
A1  - Bragard, Michael
A1  - Ronge, C.
A1  - De Doncker, R. W.
T1  - Sandwich design of high-power thyristor based devices with integrated MOSFET structure
T2  - Proceedings of the 2011 - 14th - European Conference on Power Electronics and Applications (EPE 2011) : Aug. 30, 2011 - Sept. 1, 2011, Birmingham, United Kingdom
Y1  - 2011
SN  - 978-1-61284-167-0 (Print)
SN  - 978-90-75815-15-3 (Online)
PB  - IEEE
CY  - Piscataway, NJ
ER  - 
TY  - CHAP
A1  - Bragard, Michael
A1  - Gottschlich, J.
A1  - De Doncker, R. W.
T1  - Design and realization of a credit card size driver stage for high power thyristor based devices with integrated MOS structure
T2  - 2011 IEEE 8th International Conference on Power Electronics and ECCE Asia (ICPE & ECCE 2011) : Jeju, South Korea, 30 May 2011 - 3 June 2011 / [co-sponsored by the Korean Institute of Power Electronics ...]
Y1  - 2011
SN  - 978-1-61284-958-4 (Print)
SN  - 978-1-61284-956-0 (Online)
U6  - http://dx.doi.org/10.1109/ICPE.2011.5944661
SP  - 1182
EP  - 1189
PB  - IEEE
CY  - Piscataway, NJ
ER  - 
TY  - CHAP
A1  - Magnor, D.
A1  - Soltau, N.
A1  - Bragard, Michael
A1  - Schmiegel, A.
A1  - De Doncker, R. W.
A1  - Sauer, D. U.
ED  - de Santi, Giovanni Frederigo
T1  - Analysis of the model dynamics for the battery and battery converter in a grid-connected 5 kW photovoltaic system
T2  - Proceedings / 25th European Photovoltaic Solar Energy Conference and Exhibition ; 5th World Conference on Photovoltaic Energy Conversion ; Feria Valencia, Convention & Exhibition Centre, Valencia, Spain, conference 6 - 10 September 2010, exhibition 6 - 9 September 2010 ; Joint World Conference of: 25th European Photovoltic Solar Energy Conference and Exhibition, 36th US IEEE Photovoltaic Specialists Conference, 20th Asia/Pacific PV Science and Engineering Conference
Y1  - 2010
SN  - 3-936338-26-4  (DVD-ROM)
N1  - EU PVSEC WCPEC
PB  - WIP Renewable Energies
CY  - [München]
ER  -