TY - JOUR A1 - Kern, Alexander A1 - Dikta, Gerhard T1 - Bewerten von Schäden durch Blitzeinwirkungen JF - Elektropraktiker. 62 (2008), H. 4 Y1 - 2008 SN - 0013-5569 SP - 338 EP - 342 ER - TY - JOUR A1 - Heel, Mareike van A1 - Dikta, Gerhard A1 - Braekers, Roel T1 - Bootstrap based goodness‑of‑fit tests for binary multivariate regression models JF - Journal of the Korean Statistical Society N2 - We consider a binary multivariate regression model where the conditional expectation of a binary variable given a higher-dimensional input variable belongs to a parametric family. Based on this, we introduce a model-based bootstrap (MBB) for higher-dimensional input variables. This test can be used to check whether a sequence of independent and identically distributed observations belongs to such a parametric family. The approach is based on the empirical residual process introduced by Stute (Ann Statist 25:613–641, 1997). In contrast to Stute and Zhu’s approach (2002) Stute & Zhu (Scandinavian J Statist 29:535–545, 2002), a transformation is not required. Thus, any problems associated with non-parametric regression estimation are avoided. As a result, the MBB method is much easier for users to implement. To illustrate the power of the MBB based tests, a small simulation study is performed. Compared to the approach of Stute & Zhu (Scandinavian J Statist 29:535–545, 2002), the simulations indicate a slightly improved power of the MBB based method. Finally, both methods are applied to a real data set. Y1 - 2021 U6 - http://dx.doi.org/10.1007/s42952-021-00142-4 SN - 2005-2863 (Online) SN - 1226-3192 (Print) N1 - Corresponding author: Mareike van Heel VL - 51 PB - Springer Nature CY - Singapur ER - TY - JOUR A1 - Kern, Alexander A1 - Dikta, Gerhard A1 - Krichel, Frank T1 - Zur Wahrscheinlichkeit für Schäden an elektrischen und elektronischen Einrichtungen durch indirekte Blitzeinschläge - Auswertung von Schadensstatistiken, analytischen und numerischen Berechnungen JF - 7. VDE-ABB-Blitzschutztagung : Vorträge der VDE-ABB-Fachtagung vom 15. bis 16. November 2007 in Neu-Ulm / Veranst.: Ausschuss für Blitzschutz und Blitzforschung (ABB) im VDE, Verband der Elektrotechnik, Elektronik, Informationstechnik e.V. Wiss. Tagungsltg.: K. Stimper Y1 - 2007 SN - 978-3-8007-3062-9 N1 - VDE-Fachbericht ; 64 ; Blitzschutztagung <7, 2007, Neu-Ulm> SP - 1 EP - 9 PB - VDE-Verl. CY - Berlin ER -