TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.
Y1  - 1995
N1  - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference;  NTC <1995, Orlando, Fla.>
SP  - 129
EP  - 132
ER  - 
TY  - JOUR
A1  - Unden, G.
A1  - Becker, S.
A1  - Bongaerts, Johannes
A1  - Holighaus, G.
A1  - Schirawski, J.
A1  - Six, S.
T1  - O2-sensing and O2-dependent gene regulation in facultatively anaerobic bacteria
JF  - Archives of microbiology
Y1  - 1995
SN  - 1432-072X (E-Journal); 0003-9276 (Print); 0302-8933 (Print)
VL  - Vol. 164
IS  - Iss. 2
SP  - 81
EP  - 90
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Y1  - 1995
N1  - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
SP  - 129
EP  - 136
ER  - 
TY  - JOUR
A1  - Bongaerts, Johannes
A1  - Zoschke, Sascha
A1  - Weidner, Uwe
A1  - Linden, Gottfried
T1  - Transcriptional regulation of the proton translocating NADH
JF  - Molecular microbiology
Y1  - 1995
SN  - 1365-2958 (E-Journal); 0950-382x (Print)
VL  - Vol. 16
IS  - Iss. 3
SP  - 521
EP  - 534
ER  - 
TY  - JOUR
A1  - Staat, Manfred
T1  - Reliability of an HTR-module primary circuit pressure boundary Influences, sensitivity, and comparison with a PWR
JF  - Nuclear Engineering and Design. 158 (1995), H. 2-3
Y1  - 1995
SN  - 0029-5493
SP  - 333
EP  - 340
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Hagemann, Hans-Jürgen
A1  - Bachmann, Peter K.
A1  - Lade, H.
A1  - Leers, D.
A1  - Wiechert, Detlef U.
A1  - Wilson, H.
A1  - Fournier, D.
A1  - Plamann, Karsten
T1  - Thermal properties of C/H-, C/H/O-, C/H/N- and C/H/X-grown polycrystalline CVD diamond. P. K. Bachmann, H. J. Hagemann, H. Lade,  ...
JF  - Diamond and Related Material. Vol 4. (1995), H. Issue 5-6
Y1  - 1995
SP  - 820
EP  - 826
PB  - Elsevier Science
CY  - New York, NY [u.a.]
ER  -