TY  - JOUR
A1  - Krause, Gregor
A1  - Meurer, D.
A1  - Klee, D.
T1  - Space charge formation related to the morphology of polymers
JF  - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 3
Y1  - 1989
N1  - Digital Object Identifier 10.1109/14.30883
SP  - 215
EP  - 222
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1
Y1  - 1994
SN  - 0018-9456
SP  - 18
EP  - 23
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1120
EP  - 1127
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - 15-term self-calibration methods for the error-correction of on-wafer measurements
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1105
EP  - 1110
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Line Network Network (LNN): an alternative in-fixture calibration procedure
JF  - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3
Y1  - 1997
SN  - 0018-9480
SP  - 408
EP  - 413
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Calibration procedures with series impedances and unknown lines simplify on-wafer measurements
JF  - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1
Y1  - 1999
SN  - 0018-9480
SP  - 1
EP  - 5
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Calibration of network analyser measurements with leakage errors
JF  - Electronics letters. 30 (1994), H. 1
Y1  - 1994
SN  - 0013-5194
SP  - 52
EP  - 53
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Error Corrected Impedance Measurements with a Network Analyzer
Y1  - 1994
N1  - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese
SP  - 125
EP  - 126
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Generalization of the Txx Network Analyzer Self-Calibration Procedure
JF  - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2
Y1  - 1992
SN  - 0-946821-77-1
N1  - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu <Helsinki>
SP  - 907
EP  - 912
PB  - Microwave Exhibitions and Publishers
CY  - Tunbridge Wells
ER  -