TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Maier, Horst R.
A1  - Waser, Rainer
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
JF  - Journal of the American Ceramic Society. 83 (2000), H. 6
Y1  - 2000
SN  - 0002-7820
SP  - 1433
EP  - 1440
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
A1  - Franken, Klaus
A1  - Maier, Horst R.
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
JF  - Journal of the American Ceramic Society. 83 (2000), H. 5
Y1  - 2000
SN  - 0002-7820
SP  - 1153
EP  - 1159
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Reichenberg, B.
A1  - Roelofs, A.
A1  - Waser, R.
T1  - In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements  / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
JF  - Journal of the European Ceramic Society. 24 (2004), H. 6
Y1  - 2004
SN  - 0955-2219
N1  - Electroceramics VIII
SP  - 1145
EP  - 1147
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Böttger, Ulrich
A1  - Waser, Rainer
T1  - Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
JF  - Journal of the European Ceramic Society. 22 (2002), H. 8
Y1  - 2002
SN  - 0955-2219
SP  - 1285
EP  - 1296
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Roelofs, Andreas
A1  - Schmitz, Thorsten
A1  - Reichenberg, Bernd
T1  - Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
JF  - Japanese Journal of Applied Physics. 41 (2002), H. 11B
Y1  - 2002
SN  - 0021-4922
SP  - 7198
EP  - 7201
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Meyer, René
A1  - Waser, Rainer
A1  - Schmitz, Torsten
T1  - Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, René ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan
JF  - Applied Physics Letters . 86 (2005), H. 14
Y1  - 2005
SN  - 0003-6951
SP  - 142907-1
EP  - 142907-3
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Muralt, Paul
A1  - Calame, Florian
A1  - Schmitz-Kempen, Thorsten
T1  - Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 407
EP  - 411
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Booij, W. E.
A1  - Vogl, A. H.
A1  - Wang, D. T.
T1  - A simple and powerful analytical model for MEMS piezoelectric multimorphs  / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 387
EP  - 393
ER  - 
TY  - JOUR
A1  - Hulsebosch, R. J.
A1  - Günther, C.
A1  - Horn, C.
A1  - Holtmanns, S.
A1  - Howker, K.
A1  - Paterson, K.
A1  - Claessens, J.
A1  - Schuba, Marko
ED  - Mitchell, Chris J.
T1  - Pioneering Advanced Mobile Privacy and Security
JF  - Security for mobility
Y1  - 2004
SN  - 9781849190886
U6  - http://dx.doi.org/10.1049/PBTE051E_ch
N1  - IEE telecommunications series ; 51
SP  - 383
EP  - 432
PB  - Institution of Electrical Engineers
CY  - London
ER  - 
TY  - JOUR
A1  - Schuba, Marko
A1  - Gerstenberger, Volker
A1  - Lahaije, Paul
T1  - Internet ID – Flexible Reuse of Mobile Phone Authentication Security for Service Access / Schuba, Marko ; Gerstenberger, Volker, ; Lahaije, Paul
Y1  - 2004
N1  - Nordsec 2004, Helsinki ; Nordic Workshop on Secure IT-systems <9, 2004>
SP  - 1
EP  - 7
ER  -