TY  - JOUR
A1  - Prume, Klaus
A1  - Gerber, P.
A1  - Roelofs, A.
A1  - Kügeler, C.
T1  - Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.;  Böttger, U. ; Waser, R. ; Prume, K. ;
JF  - Journal of Applied Physics  . 96 (2004), H. 5
Y1  - 2004
SN  - 0021-8979
SP  - 2800
EP  - 2804
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
T1  - Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
JF  - Proceedings of the 2000 12th IEEE International Symposium on  Applications of Ferroelectrics. Vol. 2
Y1  - 2000
N1  - ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on  Applications of Ferroelectrics
SP  - 675
EP  - 678
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Maier, Horst R.
A1  - Waser, Rainer
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
JF  - Journal of the American Ceramic Society. 83 (2000), H. 6
Y1  - 2000
SN  - 0002-7820
SP  - 1433
EP  - 1440
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Waser, Rainer
A1  - Franken, Klaus
A1  - Maier, Horst R.
T1  - Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
JF  - Journal of the American Ceramic Society. 83 (2000), H. 5
Y1  - 2000
SN  - 0002-7820
SP  - 1153
EP  - 1159
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Reichenberg, B.
A1  - Roelofs, A.
A1  - Waser, R.
T1  - In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements  / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
JF  - Journal of the European Ceramic Society. 24 (2004), H. 6
Y1  - 2004
SN  - 0955-2219
N1  - Electroceramics VIII
SP  - 1145
EP  - 1147
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Franken, Klaus
A1  - Böttger, Ulrich
A1  - Waser, Rainer
T1  - Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
JF  - Journal of the European Ceramic Society. 22 (2002), H. 8
Y1  - 2002
SN  - 0955-2219
SP  - 1285
EP  - 1296
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Roelofs, Andreas
A1  - Schmitz, Thorsten
A1  - Reichenberg, Bernd
T1  - Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
JF  - Japanese Journal of Applied Physics. 41 (2002), H. 11B
Y1  - 2002
SN  - 0021-4922
SP  - 7198
EP  - 7201
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Meyer, René
A1  - Waser, Rainer
A1  - Schmitz, Torsten
T1  - Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, René ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan
JF  - Applied Physics Letters . 86 (2005), H. 14
Y1  - 2005
SN  - 0003-6951
SP  - 142907-1
EP  - 142907-3
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Muralt, Paul
A1  - Calame, Florian
A1  - Schmitz-Kempen, Thorsten
T1  - Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 407
EP  - 411
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Booij, W. E.
A1  - Vogl, A. H.
A1  - Wang, D. T.
T1  - A simple and powerful analytical model for MEMS piezoelectric multimorphs  / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.
JF  - Journal of Electroceramics. 19 (2007), H. 4
Y1  - 2007
SN  - 1385-3449
SP  - 387
EP  - 393
ER  -