TY  - JOUR
A1  - Prume, Klaus
A1  - Gerber, P.
A1  - Roelofs, A.
A1  - Kügeler, C.
T1  - Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.;  Böttger, U. ; Waser, R. ; Prume, K. ;
JF  - Journal of Applied Physics  . 96 (2004), H. 5
Y1  - 2004
SN  - 0021-8979
SP  - 2800
EP  - 2804
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Reichenberg, B.
A1  - Roelofs, A.
A1  - Waser, R.
T1  - In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements  / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
JF  - Journal of the European Ceramic Society. 24 (2004), H. 6
Y1  - 2004
SN  - 0955-2219
N1  - Electroceramics VIII
SP  - 1145
EP  - 1147
ER  - 
TY  - JOUR
A1  - Prume, Klaus
A1  - Gerber, Peter
A1  - Kügeler, Carsten
A1  - Roelofs, Andreas
T1  - Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size  / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen,
Y1  - 2004
SN  - 0-7803-8410-5
N1  - 14th IEEE International Symposium on  Applications of Ferroelectrics, 2004. ISAF-04. 2004
SP  - 7
EP  - 10
ER  -