TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Generalization of the Txx Network Analyzer Self-Calibration Procedure
JF  - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2
Y1  - 1992
SN  - 0-946821-77-1
N1  - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu <Helsinki>
SP  - 907
EP  - 912
PB  - Microwave Exhibitions and Publishers
CY  - Tunbridge Wells
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The In-Fixture Calibration Procedure Line-Network-Network-LNN
JF  - Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community]
Y1  - 1992
SN  - 0-946821-23-2
N1  - European Microwave Conference <23, 1993, Madrid>
SP  - 500
EP  - 505
PB  - Reed Exhibition Companies
CY  - Tunbridge Wells
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
JF  - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994]
Y1  - 1994
SN  - 0-9518032-5-5
N1  - European Microwave Conference <24, 1994, Cannes>
PB  - Nexus Business Communications
CY  - Swanley
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
Y1  - 1994
N1  - 1994 IEEE MTT-S International Microwave Symposium digest : May 23 - 27, 1994, San Diego Convention Center, San Diego, California / H. J. Kuno, ed.
SP  - 1361
EP  - 1364
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2
Y1  - 1993
SN  - 0018-9456
SP  - 528
EP  - 531
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1
Y1  - 1994
SN  - 0018-9456
SP  - 18
EP  - 23
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1120
EP  - 1127
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - 15-term self-calibration methods for the error-correction of on-wafer measurements
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1105
EP  - 1110
ER  -