TY - JOUR A1 - Förster, Arnold A1 - Layet, J. M. A1 - Lüth, H. T1 - Evaluation of dopant profiles and diffusion constants by means of electron energy loss spectroscopy JF - Applied Surface Science. 41 - 42 (1989) Y1 - 1989 SN - 0169-4332 N1 - ISSN der E-Ausg.: 0169-4332 SP - 306 EP - 311 ER - TY - JOUR A1 - Förster, Arnold A1 - Resch, U. A1 - Scholz, S. M. T1 - Thermal desorption of amorphous arsenic caps from GaAs(100) monitored by reflection anisotropy spectroscopy / U. Resch ; S. M. Scholz ; U. Rossow ... A. Förter ... JF - Applied Surface Science. 63 (1993), H. 1-4 Y1 - 1993 SN - 0169-4332 N1 - ISSN der E-Ausg.: 0169-4332 SP - 106 EP - 110 ER - TY - JOUR A1 - Förster, Arnold A1 - Tulke, A. A1 - Lüth, H. T1 - The Schottky barrier at the InSb(110)–Sn interface JF - Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 5 (1987), H. 4 Y1 - 1987 SN - 1071-1023 N1 - ISSN der E-Ausg.: 0734-211X SP - 1054 EP - 1056 ER - TY - JOUR A1 - Förster, Arnold A1 - Lüth, H. T1 - Surface reactions of trimethylgallium and trimethylarsenic on silicon surfaces JF - Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 7 (1989), H. 4 Y1 - 1989 SN - 1071-1023 N1 - ISSN der E-Ausg.: 0734-211X SP - 720 EP - 724 ER - TY - JOUR A1 - Förster, Arnold A1 - Lange, J. A1 - Gerthsen, D. T1 - Effect of interface roughness and scattering on the performance of AlAs/InGaAs resonant tunneling diodes JF - Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 11 (1993), H. 4 Y1 - 1993 SN - 1071-1023 N1 - ISSN der E-Ausg.: 0734-211X SP - 1743 EP - 1747 ER - TY - JOUR A1 - Förster, Arnold A1 - Ohler, C. A1 - Moers, J. T1 - Strain dependence of the valence-band offset in arsenide compound heterojunctions determined by photoelectron spectroscopy / C. Ohler ; J. Moers ; A. Förster ... JF - Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 13 (1993), H. 4 Y1 - 1993 SN - 1071-1023 N1 - ISSN der E-Ausg.: 0734-211X SP - 1728 EP - 1735 ER - TY - JOUR A1 - Hoyler, Friedrich A1 - Mohr, P. A1 - Staudt, G. T1 - Alpha-cluster states of 212po in a realistic potential model JF - Physical review / C. 50 (1994), H. 5 Y1 - 1994 SN - 0556-2813 SP - 2631 EP - 2634 ER - TY - JOUR A1 - Hoyler, Friedrich A1 - Aprahamian, A. A1 - Wu, X. A1 - Lesher, S. R. T1 - Complete spectroscopy of the 162Dy nucleus / Aprahamian, A. ; Wu, X. ; Lesher, S. R. ; Warner, D. D. ; Gelletly, W. ; Börner, H. G. ; Hoyler, F. ; Schreckenbach, K. ; Carsten R. F. ; Shi, Z. R. ; Kusnezov, D. ; Ibrahim, M. ; Macchiavelli, A. O. ; Brinkman JF - Nuclear physics / A. 764 (2006) Y1 - 2006 SN - 0375-9474 SP - 42 EP - 78 ER - TY - JOUR A1 - Hoyler, Friedrich A1 - Shi, Z. R. A1 - Schreckenback, K. A1 - Aprahamian, A. T1 - Complete spectroscopy and the 162Dy nucleus / Z. R. Shi ; K. Schreckenbach ; A. Aprahamian ... F. Hoyler ... JF - AIP conference proceedings (1999) Y1 - 1999 SN - 0094-243X N1 - American Institute of Physics conference proceedings SP - 237 EP - 238 ER - TY - JOUR A1 - Hoyler, Friedrich A1 - Prokofjevs, P. A1 - Bondarenko, V. T1 - Study of nuclear structure of 164Dy in (n, gamma) and(n, n' gamma) reactions / P. Prokofjevs ; V. Bondarenko ; F. Hoyler ... Y1 - 1997 SN - 1122-1437 N1 - Conference proceedings - Italian Physical Society SP - 759 ER -