TY - JOUR A1 - Miyamoto, Ko-ichiro A1 - Bing, Yu A1 - Wagner, Torsten A1 - Yoshinobu, Tatsuo A1 - Schöning, Michael Josef T1 - Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor JF - Procedia Engineering N2 - The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) inthe sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface.A reduced impedance inside the defect, which was artificially formed ina cell layer, was successfully visualized in a photocurrent image. Y1 - 2015 U6 - http://dx.doi.org/10.1016/j.proeng.2015.08.806 SN - 1877-7058 N1 - Part of special issue "Eurosensors 2015" VL - 120 SP - 936 EP - 939 PB - Elsevier CY - Amsterdam ER -