TY - CHAP A1 - Heuermann, Holger A1 - Sadeghfam, Arash T1 - Analog Amplitude-Locked Loop Circuit to Support RF Energy Solutions T2 - IEEE MTT-S International Microwave Symposium Digest Y1 - 2016 SN - 978-150900698-4 U6 - http://dx.doi.org/10.1109/MWSYM.2016.7540092 ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, Arash A1 - Boehm, H. T1 - Ultra Compact Multi-Mode Filter with Novel Rat-Race Inductor. Sadeghfam, Arash; Heuermann, Holger; Boehm, H. JF - Conference proceedings : 3 - 7 October 2005, CNIT la Défense, Paris, France; [comprises the] 35th European Microwave Conference 2005 ; The European Conference on Wireless Technology 2005 ; European Radar Conference 2005 ; GAAS 2005, The European Gallium A. Vol. 2 Y1 - 2005 SN - 2-9600551-0-1 N1 - European Microwave Conference ; (35, 2005, Paris) ; European Microwave Week ; (2005, Paris) SP - 4 pp. PB - Horizon House Publ CY - London ER - TY - CHAP A1 - Heuermann, Holger A1 - Sadeghfam, Arash A1 - Finger, Torsten T1 - Alternative ignition system based on microwave plasma T2 - Advanced ignition systems for gasoline engines : [Vorträge der 1st International Conference Advanced Ignition Systems for Gasoline Engines - 1. Internationale Tagung Zündsysteme für Ottomotoren, 12.-13. November 2012, Berlin] Y1 - 2013 SN - 9783816931904 SP - 95 EP - 103 PB - Expert-Verl. CY - Renningen ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2 Y1 - 1993 SN - 0018-9456 SP - 528 EP - 531 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1 Y1 - 1994 SN - 0018-9456 SP - 18 EP - 23 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Error corrected impedance measurements with a network analyzer JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2 Y1 - 1995 SN - 0018-9456 SP - 295 EP - 299 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1120 EP - 1127 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - 15-term self-calibration methods for the error-correction of on-wafer measurements JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1105 EP - 1110 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Line Network Network (LNN): an alternative in-fixture calibration procedure JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3 Y1 - 1997 SN - 0018-9480 SP - 408 EP - 413 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Calibration of network analyser measurements with leakage errors JF - Electronics letters. 30 (1994), H. 1 Y1 - 1994 SN - 0013-5194 SP - 52 EP - 53 ER -