TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
Y1  - 1994
N1  - 1994 IEEE MTT-S International Microwave Symposium digest : May 23 - 27, 1994, San Diego Convention Center, San Diego, California / H. J. Kuno, ed.
SP  - 1361
EP  - 1364
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2
Y1  - 1993
SN  - 0018-9456
SP  - 528
EP  - 531
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1
Y1  - 1994
SN  - 0018-9456
SP  - 18
EP  - 23
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1120
EP  - 1127
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - 15-term self-calibration methods for the error-correction of on-wafer measurements
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1105
EP  - 1110
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
A1  - Boehm, H.
T1  - Ultra Compact Multi-Mode Filter with Novel Rat-Race Inductor. Sadeghfam, Arash; Heuermann, Holger; Boehm, H.
JF  - Conference proceedings : 3 - 7 October 2005, CNIT la Défense, Paris, France; [comprises the] 35th European Microwave Conference 2005 ; The European Conference on Wireless Technology 2005 ; European Radar Conference 2005 ; GAAS 2005, The European Gallium A. Vol. 2
Y1  - 2005
SN  - 2-9600551-0-1
N1  - European Microwave Conference ; (35, 2005, Paris) ; European Microwave Week ; (2005, Paris)
SP  - 4 pp.
PB  - Horizon House Publ
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
T1  - Novel balanced inductor for compact differential systems / Sadeghfam, Arash; Heuermann, Holger
JF  - Conference proceedings : Tuesday 12th, Wednesday 13th and Thursday 14th October, [RAI International Exhibition and Congress Centre, Amsterdam ; part of European Microwave Week 2004] / EuMA, European Microwave Association
Y1  - 2004
SN  - 1-580-53992-0
N1  - European Microwave Conference ; (34, 2004, Amsterdam) ; European Microwave Week ; (7, 2004, Amsterdam)
SP  - 709
EP  - 712
PB  - Horizon House Publ.
CY  - London
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Sadeghfam, Arash
T1  - Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger
JF  - European Microwave Conference, 2008, EuMC 2008, 38th
Y1  - 2008
SN  - 978-2-87487-006-4
SP  - 1727
EP  - 1730
ER  -