TY - CHAP A1 - Lindner, Marvin A1 - Kolb, Andreas A1 - Ringbeck, Thorsten T1 - New insights into the calibration of ToF-sensors T2 - 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition workshops : Anchorage, AK, 23 - 28 June 2008 N2 - Time-of-flight (ToF) sensors have become an alternative to conventional distance sensing techniques like laser scanners or image based stereo. ToF sensors provide full range distance information at high frame-rates and thus have a significant impact onto current research in areas like online object recognition, collision prevention or scene reconstruction. However, ToF cameras like the photonic mixer device (PMD) still exhibit a number of challenges regarding static and dynamic effects, e.g. systematic distance errors and motion artefacts, respectively. Sensor calibration techniques reducing static system errors have been proposed and show promising results. However, current calibration techniques in general need a large set of reference data in order to determine the corresponding parameters for the calibration model. This paper introduces a new calibration approach which combines different demodulation techniques for the ToF- camera 's reference signal. Examples show, that the resulting combined demodulation technique yields improved distance values based on only two required reference data sets. Y1 - 2008 SN - 978-1-4244-2339-2 SN - 978-1-4244-2340-8 SP - 1 EP - 5 PB - IEEE Service Center CY - Piscataway, NJ ER - TY - JOUR A1 - Lerchl, Alexander A1 - Krüger, Heike A1 - Niehaus, Michael A1 - Streckert, Joachim R. A1 - Bitz, Andreas A1 - Hansen, Volkert T1 - Effects of mobile phone electromagnetic fields at nonthermal SAR values on melatonin and body weight of Djungarian hamsters (Phodopus sungorus) JF - Journal of Pineal Research Y1 - 2008 U6 - http://dx.doi.org/10.1111/j.1600-079X.2007.00522.x SN - 1600-079X VL - 44 IS - 3 SP - 267 EP - 272 ER - TY - JOUR A1 - Hüning, Felix T1 - Die Anforderungen steigen : Entwicklungstrends bei MOSFETs für den Automobilbereich JF - Elektronik-Industrie. 39 (2008), H. 5 Y1 - 2008 SN - 0174-5522 SP - 74 EP - 76 PB - - ER - TY - JOUR A1 - Hüning, Felix T1 - Robusti affidabili per le Sfide dell’automotive JF - Selezione di Elettronica (2008) Y1 - 2008 SP - 116 EP - 117 PB - - ER - TY - JOUR A1 - Hüning, Felix T1 - Entwicklungstrends bei MOSFETs für den Automobilbereich JF - Elektronik-Industrie . 39 (2008), H. 5 Y1 - 2008 SN - 0174-5522 SP - 74 EP - 76 PB - - ER - TY - JOUR A1 - Hoffmann, Ulrich T1 - Neue Wege in die Hochschule – Beispiel des berufsbegleitenden Studienganges Prozesstechnik der FH Aachen und der Rhein-Erft Akademie JF - HIS: Forum Hochschule. 2008 (2008), H. F14 Y1 - 2008 SN - 1863-5563 SP - 130 EP - 138 ER - TY - JOUR A1 - Hillgärtner, Michael A1 - Peier, Dirk T1 - Nutzbarkeit bestehender, geschirmter Labore als Modenverwirbelungskammer JF - Elektromagnetische Verträglichkeit : EMV 2008, Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit, 19. - 21. Februar 2008, Messe Düsseldorf / Gonschorek, Karl-Heinz Y1 - 2008 SN - 978-3-8007-3075-9 N1 - EMV <2008, Stuttgart> ; Mesago-Messe-Frankfurt <2008, Stuttgart> SP - 579 EP - 586 PB - VDE-Verl. CY - Berlin [u.a.] ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, Arash T1 - Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger JF - European Microwave Conference, 2008, EuMC 2008, 38th Y1 - 2008 SN - 978-2-87487-006-4 SP - 1727 EP - 1730 ER - TY - JOUR A1 - Heuermann, Holger A1 - Sadeghfam, Arash T1 - Electrically tunable bandpass filter with integrated carrier suppression for UHF RFID systems / Sadeghfam, Arash ; Heuermann, Holger JF - European Conference on Wireless Technology, 2008. EuWiT 2008. Y1 - 2008 SN - 978-2-87487-008-8 SP - 306 EP - 309 ER - TY - JOUR A1 - Heuermann, Holger A1 - Ibrahim, Irfan T1 - Novel theory and architecture of a vector signal generator implemented with two PLLs / Ibrahim, Irfan ; Heuermann, Holger JF - European Conference on Wireless Technology, 2008. EuWiT 2008. Y1 - 2008 SN - 978-2-87487-008-8 SP - 85 EP - 88 ER -