TY - JOUR A1 - Schuba, Marko T1 - Analysis of Feedback Error Control Schemes for Block Based Video Communication / Meggers, Jens ; Schuba, Marko Y1 - 1999 ER - TY - JOUR A1 - Biselli, Manfred A1 - Klyushnichenko, Vadim A1 - Rodenbrock, Anja A1 - Thömmes, Jörg T1 - Analysis of Hybridoma Cell Culture Processes by SDS-Gel Capillary Electrophoresis and matrix-assisted laser desorption ionization–time-of-flight MS / Vadim Klyushnichenko, Anja Rodenbrock, Jörg Thömmes, Maria-Regina Kula, Holger Heine, Manfred Biselli JF - Biotechnology and Applied Biochemistry. 27 (1998), H. 3 Y1 - 1998 SN - 0885-4513 SP - 181 EP - 188 ER - TY - JOUR A1 - Scherer, Ulrich W. A1 - Santana, H. H. S. A1 - Maier, G. A1 - Rodenas, J. T1 - Analysis of mechanical strength in ceramic pellets of nuclear fuel / Santana, H. H. S. ; Maier, G. ; Scherer, U. W. ; Rodenas, J. JF - Radiation effects and defects in solids. 164 (2009), H. 5-6 Y1 - 2009 SN - 1042-0150 SP - 313 EP - 318 PB - Taylor & Francis CY - London ER - TY - JOUR A1 - Vu, Duc Khoi A1 - Staat, Manfred A1 - Tran, Ich Thinh T1 - Analysis of pressure equipment by application of the primal-dual theory of shakedown JF - Communications in Numerical Methods in Engineering. 23 (2007), H. 3 Y1 - 2007 SN - 1069-8299 SP - 213 EP - 225 ER - TY - JOUR A1 - Prume, Klaus A1 - Peter, F. A1 - Rüdiger, A. A1 - Dittmann, R. T1 - Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; Rüdiger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ; JF - Applied Physics Letters . 87 (2005), H. 8 Y1 - 2005 SN - 0003-6951 SP - 082901 EP - 082901-3 ER - TY - JOUR A1 - Levers, A. A1 - Staat, Manfred A1 - Laack, Walter van T1 - Analysis of the long-term effect of the MBST® nuclear magnetic resonance therapy on gonarthrosis JF - Orthopedic Practice Y1 - 2016 VL - 47 IS - 11 SP - 521 EP - 528 ER - TY - JOUR A1 - Ayala, Rafael Ceja A1 - Harris, Isaac A1 - Kleefeld, Andreas A1 - Pallikarakis, Nikolaos T1 - Analysis of the transmission eigenvalue problem with two conductivity parameters JF - Applicable Analysis N2 - In this paper, we provide an analytical study of the transmission eigenvalue problem with two conductivity parameters. We will assume that the underlying physical model is given by the scattering of a plane wave for an isotropic scatterer. In previous studies, this eigenvalue problem was analyzed with one conductive boundary parameter whereas we will consider the case of two parameters. We prove the existence and discreteness of the transmission eigenvalues as well as study the dependence on the physical parameters. We are able to prove monotonicity of the first transmission eigenvalue with respect to the parameters and consider the limiting procedure as the second boundary parameter vanishes. Lastly, we provide extensive numerical experiments to validate the theoretical work. KW - Transmission Eigenvalues KW - Conductive Boundary Condition KW - Inverse Scattering Y1 - 2023 U6 - https://doi.org/10.1080/00036811.2023.2181167 SN - 0003-6811 PB - Taylor & Francis ER - TY - JOUR A1 - Mourzina, Y. G. A1 - Ermelenko, Y. E. A1 - Yoshinobu, T. A1 - Vlasov, Y. A1 - Iwasaki, H. A1 - Schöning, Michael Josef T1 - Anionselective light-addressable potentiometric sensors (LAPS) for the determination of nitrate and suphate ions JF - Sensors and Actuators B. 91 (2003), H. 1-3 Y1 - 2003 SN - 0925-4005 SP - 32 EP - 38 ER - TY - JOUR A1 - Barsov, S. A1 - Bechstedt, U. A1 - Hardt, Arno T1 - ANKE, a new facility for medium energy hadron physics at COSY-Jülich / S. Barsov [u.a.] JF - Nuclear instruments and methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. Vol. 462, iss. 3 Y1 - 2001 SN - 0167-5087 (Print) ; 0168-9002 (E-journal) SP - 364 EP - 381 ER - TY - JOUR A1 - Förster, Arnold A1 - Darmo, J. A1 - Dubecký, F. A1 - Kordos, P. T1 - Annealing characteristics of native defects in low-temperature-grown MBE GaAs / J. Darmo ; F. Dubecky ; P. Kordos ; A. Förster JF - Semiconducting and insulating materials 1996 : proceedings of the 9th Conference on Semiconducting and Insulating Materials (SIMC '9), April 29 - May 3, 1996, Toulouse, France / [IEEE] Y1 - 1996 SN - 0-7803-3095-1 N1 - 2. ISBN: 0-7803-3179-6 ; Conference on Semiconducting and Insulating Materials <9, 1996, Toulouse> ; Institute of Electrical and Electronics Engineers ; IEEE Cat. No.96CH35881 SP - 67 EP - ff. CY - Piscataway, NJ [u.a.] ER -