TY - JOUR A1 - Kern, Alexander A1 - Wiesinger, J. A1 - Zischank, Wolfgang J. T1 - Calculation of the longitudinal voltage along metal tubes caused by lightning currents and protection measures JF - Seventh International Symposium on High Voltage Engineering : Dresden, August 26 - 30 1991 Y1 - 1991 N1 - International Symposium on High Voltage Engineering <7, 1991, Dresden> PB - Techn. Univ. CY - Dresden ER - TY - JOUR A1 - Kern, Alexander A1 - Schelthoff, Christof A1 - Mathieu, Moritz T1 - Calculation of interception efficiencies for airterminations using a dynamic electro-geometrical model Y1 - 2011 N1 - XI International Symposium on Lightning Protection (SIPDA), Fortaleza (Brasilien), 2011. SP - 1 EP - 6 PB - IEEE CY - New York ER - TY - JOUR A1 - Heel, Mareike van A1 - Dikta, Gerhard A1 - Braekers, Roel T1 - Bootstrap based goodness‑of‑fit tests for binary multivariate regression models JF - Journal of the Korean Statistical Society N2 - We consider a binary multivariate regression model where the conditional expectation of a binary variable given a higher-dimensional input variable belongs to a parametric family. Based on this, we introduce a model-based bootstrap (MBB) for higher-dimensional input variables. This test can be used to check whether a sequence of independent and identically distributed observations belongs to such a parametric family. The approach is based on the empirical residual process introduced by Stute (Ann Statist 25:613–641, 1997). In contrast to Stute and Zhu’s approach (2002) Stute & Zhu (Scandinavian J Statist 29:535–545, 2002), a transformation is not required. Thus, any problems associated with non-parametric regression estimation are avoided. As a result, the MBB method is much easier for users to implement. To illustrate the power of the MBB based tests, a small simulation study is performed. Compared to the approach of Stute & Zhu (Scandinavian J Statist 29:535–545, 2002), the simulations indicate a slightly improved power of the MBB based method. Finally, both methods are applied to a real data set. Y1 - 2021 U6 - http://dx.doi.org/10.1007/s42952-021-00142-4 SN - 2005-2863 (Online) SN - 1226-3192 (Print) N1 - Corresponding author: Mareike van Heel VL - 51 PB - Springer Nature CY - Singapur ER - TY - JOUR A1 - Rateike, Franz-Matthias A1 - Siebourg, W. A1 - Schmid, H. A1 - Anders, S. T1 - Birefringence - An important property of plastic substrates for magneto-optical storage disks / W. Siebourg ; H. Schmid ; F. M. Rateike ; S. Anders ; U. Grigo ; H. Löwer JF - Polymer engineering & science / Society of Plastics Engineers. 30 (1990), H. 18 Y1 - 1990 SN - 0032-3888 SP - 1133 EP - 1139 ER - TY - JOUR A1 - Darmo, J. A1 - Schäffer, F. A1 - Förster, Arnold A1 - Kordos, P. T1 - Beryllium doped low-temperature-grown MBE GaAs: material for photomixing in the THz frequency range JF - ASDAM 2000 : conference proceedings / edited by Jozef Osvald ... [et al.] Y1 - 2000 SN - 0780359399 N1 - International Conference on Advanced Semiconductor Devices and Microsystems ; (3rd : ; 2000 : ; Smolenice, Slovakia) SP - 147 EP - 150 PB - IEEE CY - Piscataway, NJ ER - TY - JOUR A1 - Förster, Arnold A1 - Ohler, C. A1 - Daniels, C. T1 - Barrier height at clean Au/InAs(100) interfaces / C. Ohler ; C. Daniels ; A. Förster ... JF - Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 15 (1997), H. 3 Y1 - 1997 SN - 0169-4332 SP - 702 EP - 706 ER - TY - JOUR A1 - Förster, Arnold A1 - Ohler, C. A1 - Moers, J. T1 - Band offsets at heavily strained III - V interfaces / C. Ohler ; A. Förster ; J. Moers... JF - Journal of Physics D: Applied Physics. 30 (1997), H. 10 Y1 - 1997 SN - 0022-3727 N1 - ISSN der E-Ausg.: 1361-6463 SP - 1436 EP - 1441 ER - TY - JOUR A1 - Marx, Ulrich A1 - Schenk, Friedrich A1 - Behrens, Jan A1 - Meyr, Ulrike A1 - Wanek, Paul A1 - Zang, Werner A1 - Schmitt, Robert A1 - Brüstle, Oliver A1 - Zenke, Martin A1 - Klocke, Fritz T1 - Automatic production of induced pluripotent stem cells JF - Procedia CIRP : First CIRP Conference on BioManufacturing Y1 - 2013 SN - 2212-8271 VL - Vol. 5 SP - 2 EP - 6 PB - Elsevier CY - Amsterdam ER - TY - JOUR A1 - Förster, Arnold A1 - Rosenauer, A. A1 - Remmele, T. T1 - Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. Förster JF - Optik : international journal for light and electron optics. 105 (1997), H. 3 Y1 - 1997 SN - 0030-4026 SP - 99 EP - 107 ER - TY - JOUR A1 - Förster, Arnold A1 - Rosenauer, A. A1 - Oberst, W. A1 - Gerthsen, D. T1 - Atomic scale analysis of the indium distribution in InGaAs/GaAs (001) heterostructures: segregation, lateral indium redistribution and the effect of growth interruptions. Rosenauer, A. ; Oberst, W. ; Gerthsen, D. ; Förster, A. JF - Thin Solid Films. 357 (1999) Y1 - 1999 SN - 0040-6090 SP - 18 EP - 21 ER -