TY  - JOUR
A1  - Kloock, Joachim P.
A1  - Poghossian, Arshak
A1  - Schumacher, K.
A1  - Rosenkranz, C.
A1  - Schultze, J. W.
A1  - Müller-Veggian, Mattea
A1  - Schöning, Michael Josef
T1  - Funktionsprüfung und Charakterisierung von ionensensitiven Feldeffekttransistoren (ISFETs) auf Waferebene mittels Mikrotropfenzelle für den zukünftigen Einsatz in der Sensorproduktion
JF  - Sensoren und Messsysteme 2006 : Vorträge der 13. ITG/GMA-Fachtagung vom 13. bis 14. März 2006 in Freiburg/Breisgau / Veranst.: Informationstechnische Gesellschaft im VDE (ITG) ; VDE/VDI-Gesellschaft Mess- und Automatisierungstechnik (GMA). Wiss. Tagungsleitung: L. M. Reindl
Y1  - 2006
SN  - 3-8007-2939-3
N1  - Fachtagung Sensoren und Messsysteme <13, 2006, Freiburg, Breisgau>
SP  - 257
EP  - 260
PB  - VDE-Verl.
CY  - Berlin
ER  - 
TY  - JOUR
A1  - Müller-Veggian, Mattea
A1  - Moro, D.
A1  - Ferreti, A.
A1  - Colautti, P.
T1  - The new articulated twin mini TEPC
JF  - Annual Report  2006 / Istituto Nazionale di Fisica Nucleare <Frascati> / Laboratori Nazionali <Legnaro>
Y1  - 2006
SP  - 273
CY  - Legnaro
ER  - 
TY  - JOUR
A1  - Streun, M.
A1  - Chavan, U.
A1  - Lame, H.
A1  - Parl, C.
A1  - Müller-Veggian, Mattea
A1  - Ziemons, Karl
T1  - Treating the Gain Non-Uniformity of Multi Channel PMTs by Channel-Specific Trigger Levels
JF  - 2006 IEEE Nuclear Science Symposium Conference Record, Vol. 2.
Y1  - 2006
SN  - 1082-3654
SP  - 1301
EP  - 1304
CY  - San Diego, CA
ER  - 
TY  - CHAP
A1  - Poghossian, Arshak
A1  - Schumacher, Kerstin
A1  - Kloock, Joachim P.
A1  - Rosenkranz, Christian
A1  - Schultze, Joachim W.
A1  - Müller-Veggian, Mattea
A1  - Schöning, Michael Josef
T1  - Functional testing and characterisation of ISFETs on wafer level by means of a micro-droplet cell
N2  - A wafer-level functionality testing and characterisation system for ISFETs (ionsensitive field-effect transistor) is realised by means of integration of a specifically designed capillary electrochemical micro-droplet cell into a commercial wafer prober-station. The developed system allows the identification and selection of “good” ISFETs at the earliest stage and to avoid expensive bonding, encapsulation and packaging processes for nonfunctioning ISFETs and thus, to decrease costs, which are wasted for bad dies. The developed system is also feasible for wafer-level characterisation of ISFETs in terms of sensitivity, hysteresis and response time. Additionally, the system might be also utilised for wafer-level testing of further electrochemical sensors.
KW  - Biosensor
KW  - Biosensorik
KW  - ISFET
KW  - Wafer
KW  - ISFET
KW  - wafer-level testing
KW  - capillary micro-droplet cell
Y1  - 2006
U6  - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:hbz:a96-opus-1259
ER  -