TY  - JOUR
A1  - Benkner, Thorsten
T1  - Autonomous Slot Assignment Schemes for PRMA++ Third Generation TDMA Systems
JF  - Proceedings / Organization: IEEE Vehicular Technology/Communications Society; Joint Chapter in the Benelux Section and Telecommunications Division, Eindhoven University of Technology, The Netherlands. Ed.: Peter Smulders
Y1  - 1995
SN  - 9061449928
N1  - Symposium on Communications and Vehicular Technology in the Benelux ; (3, 1995, Eindhoven) ; Vehicular Technology Society ; Communications Society ; Institute of Electrical and Electronics Engineers. ; Benelux ; Technische Universiteit. ; Telecommunicatio
PB  - Techn. Univ. Eindhoven, Telecommunications Div.
CY  - Eindhoven
ER  - 
TY  - JOUR
A1  - Hagemann, Hans-Jürgen
A1  - Bachmann, P. K.
A1  - Lade, H.
A1  - Leers, D.
T1  - Thermal properties of C/H-, C/H/O-, C/H/N- and C/H/X-grown polycrystalline CVD diamond. P. K. Bachmann, H. J. Hagemann, H. Lade,  ...
JF  - Diamond and Related Material. Vol 4. (1995), H. Issue 5-6
Y1  - 1995
N1  - <a href="http://dx.doi.org/10.1016/0925-9635(94)05229-8">abstract online:</a>
SP  - 820
EP  - 826
PB  - Elsevier Science
CY  - New York, NY [u.a.]
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.
Y1  - 1995
N1  - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference;  NTC <1995, Orlando, Fla.>
SP  - 129
EP  - 132
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Y1  - 1995
N1  - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
SP  - 129
EP  - 136
ER  - 
TY  - JOUR
A1  - Jacobs, Stephan
A1  - Holten, Roland
T1  - Goal Driven Business Modelling - Supporting Decision Making within Information System Development
JF  - Conference on Organizational Computing Systems : August 13 - 16, 1995, Milpitas, Calif. / general ed. Nora Comstock ...
Y1  - 1995
SN  - 0-89791-706-5
N1  - Conference on Organizational Computing Systems <1995, Milpitas, Calif.>
PB  - ACM
CY  - New York, NY
ER  - 
TY  - JOUR
A1  - Schöning, Michael Josef
A1  - Sauke, M.
A1  - Steffen, A.
A1  - Marso, M. (u.a.)
T1  - Ion-sensitive field-effect transistors with ultrathin Langmuir-Blodgett membranes
JF  - Sensors and Actuators B. 27 (1995), H. 1-3
Y1  - 1995
SN  - 0925-4005
SP  - 325
EP  - 328
ER  - 
TY  - JOUR
A1  - Schäfer, Horst
A1  - Uebbing, H.
A1  - Stolz, H.
A1  - von der Osten, W. (u.a.)
T1  - Resonance Brillouin Scattering from Quantized Exciton-Polaritons in Ultrathin Epitaxial Layers of ZnSe
JF  - Il nuovo Cimento D. 17 (1995)
Y1  - 1995
SN  - 0392-6737
SP  - 1753
EP  - 1757
ER  - 
TY  - JOUR
A1  - Schäfer, Horst
A1  - Scholl, S.
A1  - Gerschütz, F.
A1  - Fischer, F. (u.a.)
T1  - Persistent Photoconductivity in Halogen-doped Cd1-X ZnX Te, Cd1-X MnX Te and Cd1-X-MgX -Te Layers
JF  - 22nd International Conference on the Physics of Semiconductors : Vancouver, Canada, August 15 - 19, 1994 / ed. David J. Lockwood
Y1  - 1995
SN  - 981-02-2021-9
SP  - 2423
EP  - 2426
PB  - World Scientific
CY  - Singapore [u.a.]
ER  -