TY  - JOUR
A1  - Heuermann, Holger
T1  - Microwave On-Wafer Measurements with Activ Needle Probe Tips
Y1  - 1997
N1  - 47th ARFTG Conference digest : June 20 - 21, 1996, Moscone Convention Center, San Francisco, California / Automatic RF Techniques Group. [Publication chair: Ed Godshalk
SP  - 208
EP  - 214
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Praezise Streuparametermessungen sind der Schluessel zur Modellierung elektrischer Schaltungen
JF  - Neues von Rohde & Schwarz (1997)
Y1  - 1997
SP  - 22
EP  - 23
ER  - 
TY  - JOUR
A1  - Wolf, Martin R.
A1  - Schlick, Christopher
A1  - Springer, J.
ED  - Miyamoto, Hiroyuki
T1  - The use of implicit communication mechanisms in desktop-teleconferencing-systems
JF  - Proceedings of WWDU '97 Tokyo, Fifth International Scientific Conference on Work with Display Units : November 3 - 5, 1997, Tokyo
Y1  - 1997
N1  - International Scientific Conference on Work with Display Units ; International Scientific Conference on Work with Display Units ; (5 ; 1997.11.03-05 ; Tokyo)
SP  - 193
EP  - 194
PB  - -
CY  - Tokyo
ER  - 
TY  - CHAP
A1  - Elsen, Ingo
A1  - Kraiss, Karl-Friedrich
A1  - Krumbiegel, Dirk
T1  - Pixel based 3D object recognition with bidirectional associative memories
T2  - International Conference on Neural Networks 1997
N2  - This paper addresses the pixel based recognition of 3D objects with bidirectional associative memories. Computational power and memory requirements for this approach are identified and compared to the performance of current computer architectures by benchmarking different processors. It is shown, that the performance of special purpose hardware, like neurocomputers, is between one and two orders of magnitude higher than the performance of mainstream hardware. On the other hand, the calculation of small neural networks is performed more efficiently on mainstream processors. Based on these results a novel concept is developed, which is tailored for the efficient calculation of bidirectional associative memories. The computational efficiency is further enhanced by the application of algorithms and storage techniques which are matched to characteristics of the application at hand.
Y1  - 1997
SN  - 0-7803-4122-8
N1  - June 9 - 12, 1997, Westin Galleria Hotel Houston, Texas, USA.
SP  - 1679
EP  - 1684
PB  - IEEE
CY  - New York
ER  - 
TY  - JOUR
A1  - Wolf, Martin R.
A1  - Armbruster, S.
A1  - Schlick, Christopher
A1  - Simon, S.
T1  - Marktübersicht Telekooperationssysteme / Wolf, M.; Armbruster, S.; Schlick, C.; Simon, S.
JF  - Elsa Insight (1997)
Y1  - 1997
SP  - 8
EP  - 9
PB  - -
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Leerläufe als postulierte Kalibrierstandards fuer Messungen auf planaren Schaltungen
JF  - tm - Technisches Messen. 64. 1997 (1997), H. 6
Y1  - 1997
SP  - 230
EP  - 237
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Line Network Network (LNN): an alternative in-fixture calibration procedure
JF  - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3
Y1  - 1997
SN  - 0018-9480
SP  - 408
EP  - 413
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Graf, W.
T1  - Direkte Messung der Dispersion des Wellenwiderstandes einer Mikrostreifenleitung
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 40. 1997 (1997)
Y1  - 1997
ER  - 
TY  - JOUR
A1  - Wolf, Martin R.
A1  - Simon, S.
A1  - Schlick, Christopher
T1  - Computergestützte Kooperation - Eine Seifenblase? / Wolf, M.; Simon, S.; Schlick, C.
JF  - Rechnergestützte Kooperation in Verwaltungen und großen Unternehmen : Tagungsband zum Workshop der GI-Gachgruppe / Peter Mambrey ... ( Hrsg.)
Y1  - 1997
SP  - 220
EP  - 234
PB  - Univ., Fachbereich Mathematik u. Informatik
CY  - Essen
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - 15-term self-calibration methods for the error-correction of on-wafer measurements
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1105
EP  - 1110
ER  -