TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
JF  - Conference proceedings
Y1  - 1995
N1  - European Microwave Conference <25, 1995, Bologna>
SP  - 343
EP  - 347
PB  - NEXUS House
CY  - Kent
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.
Y1  - 1995
N1  - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference;  NTC <1995, Orlando, Fla.>
SP  - 129
EP  - 132
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Neuartige Algorithmen fuer die Mikrowellen-Entfernungsmessung
JF  - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 38. 1995 (1995)
Y1  - 1995
SP  - 817
EP  - 834
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Selbstkalibrierverfahren zur Systemfehlerkorrektur von Streuparametermessungen auf Halbleitersubstraten
JF  - Mikrowellen und Optronik : Kongreßunterlagen = Microwaves and optronics / MIOP '95, 8. Kongreßmesse für Hochfrequenztechnik, Messehalle Sindelfingen, 30. Mai - 1. Juni 1995. [Hrsg.: Network GmbH]
Y1  - 1995
SN  - 3-924651-45-0
N1  - MIOP ; (8, 1995, Sindelfingen)
SP  - 23
EP  - 29
CY  - Hagenburg
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Y1  - 1995
N1  - 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
SP  - 129
EP  - 136
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Auswertemethoden zur Praezisions-Entfernungsmessung mit FMCW-Systemen und deren Anwendung im Mikrowellenbereich
JF  - tm - Technisches Messen. 62. 1995 (1995), H. 2
Y1  - 1995
SP  - 66
EP  - 73
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Benkner, Thorsten
T1  - Investigation of mobile antenna diagrams on cochannel interference
JF  - Proceedings / Organization: IEEE Vehicular Technology/Communications Society; Joint Chapter in the Benelux Section. Ed.: L. Vandendorpe
Y1  - 1994
N1  - Symposium on Communications and Vehicular Technology in the Benelux ; (2, 1994, Louvain-la-Neuve) ; Vehicular Technology Society ; Communications Society ; Institute of Electrical and Electronics Engineers. ; Benelux ; IEEE Symposium on Communications and
PB  - Univ. Catholoque de Louvain
CY  - Loovain
ER  - 
TY  - JOUR
A1  - Benkner, Thorsten
T1  - Full Adaptive Channel Assignment Schemes for PRMA++ Cellular Mobile Radio Systems
Y1  - 1994
N1  - IEEE Workshop on Mobility Management for Personal Communications. George Mason University, Fairfax, Virginia, USA, 8.-9. September 1994
ER  - 
TY  - JOUR
A1  - Hagemann, Hans-Jürgen
A1  - Bachmann, P.K.
A1  - Lade, H.
A1  - Leers, D.
T1  - CVD Diamond Growth: Gas Compositions and Film Properties / P.K. Bachmann, H.J. Hagemann, H. Lade, D. Leers, D.U. Wiechert and H. Wilson
JF  - Advanced materials '94 : proceedings of the NIRIM International Symposium on Advanced Materials '94, Tsukuba, Japan, March 13 - 17, 1994 / National Institute for Research in Inorganic Materials. Ed. by M. Kamo ...
Y1  - 1994
N1  - NIRIM International Symposium on Advanced Materials ; 1994 (Tsukuba) : 1994.03.13-17
SP  - 115
EP  - 120
PB  - International Communications Specialists
CY  - Tokyo
ER  -