TY - CHAP A1 - Köllensperger, P. A1 - Bragard, Michael A1 - Plum, T. A1 - De Doncker, R. W. T1 - The dual GCT : a new high-power device using optimized GCT technology T2 - Conference record of the 2007 IEEE Industry Applications Conference : 42. IAS annual meeting ; September 23 - 27, 2007, New Orleans, Louisiana, USA Y1 - 2007 SN - 978-1-4244-1260-0 (Online) SN - 978-1-4244-1259-4 (Print) U6 - https://doi.org/10.1109/07IAS.2007.76 SP - 358 EP - 365 PB - IEEE Operations Center CY - Piscataway, NJ ER - TY - CHAP A1 - Hagebeuker, Bianca A1 - Ringbeck, Thorsten A1 - Frydlewicz, Paul A1 - Jesorsky, Oliver A1 - Sünkel, Thomas ED - Grote, Caspar T1 - PMD-Sensoren als Schlüsselkomponenten für die mehrdimensionale Umfelderfassung des Fahrzeuginnenraums T2 - Begleittexte zum Entwicklerforum KFZ-Elektronik & FlexRay Solution Day : 15.Mai 2007, Ludwigsburg Y1 - 2007 N1 - Entwicklerforum Kfz-Elektronik <2007, Ludwigsburg> ; FlexRay Solution Day <2007, Ludwigsburg> SP - 287 EP - 296 PB - WEKA-Fachzeitschr.-Verl. CY - Poing ER - TY - CHAP A1 - Ringbeck, Thorsten A1 - Hagebeuker, Bianca ED - Grün, Armin T1 - A 3D time of flight camera of object detection T2 - Optical 3-D measurement techniques VIII : applications in GIS, mapping, manufacturing, quality control, robotics, navigation, mobile mapping, medical imaging, cultural heritage, VR generation and animation; papers presented to the conference organized at ETH Zurich, Switzerland, July 9 - 12, 2007. - Vol. 1 Y1 - 2007 SN - 3-906467-67-8 (Gesamtwerk) N1 - Conference on Optical 3-D Measurement Techniques <8, 2007, Zürich> SP - 1 EP - 16 PB - ETH CY - Zürich ER - TY - CHAP A1 - Ferrein, Alexander A1 - Lakemeyer, Gerhard A1 - Schiffer, Stefan T1 - AllemaniACs@ home 2006 team description Y1 - 2006 SP - 1 EP - 6 ER - TY - CHAP A1 - Hillgärtner, Michael A1 - Kappel, U. T1 - Radiating Impedance of Mains Cabling During Emissions Testing T2 - Proceedings of EMC Europe 2006 Barcelona : International Symposium on Electromagnetic Compatibility Y1 - 2006 SN - 84-689-9439-1 N1 - MC Europe 2006, Barcelona: International Symposium on Electromagnetic Compatibility : September 4-8, 2006 Barcelona, Spain SP - 17 EP - 22 CY - Barcelona ER - TY - CHAP A1 - Bitz, Andreas A1 - El Ouardi, A. A1 - Streckert, J. A1 - Hansen, V. T1 - Efficient calculation of human exposure in front of base station antennas by a combination of the FDTD and Hybrid(2)-method T2 - Proceedings of the 16th International Zurich Symposium on Electromagnetic Compatibility, Topical Meeting on Biomedical EMC, Zurich, Switzerland, February 2005 Y1 - 2005 SN - 3-9521199-9-7 SP - 115 EP - 118 PB - ETH Zentrum CY - Zürich ER - TY - CHAP A1 - Gligorevic, Snjezana A1 - Bott, Rainer A1 - Sorger, Ulrich ED - Fazel, Khaled T1 - Equalization for multi-carrier systems in time-varying channels T2 - Multi-carrier spread-spectrum for future generation wireless systems : fourth international workshop, Germany, September 17-19, 2003 Y1 - 2004 SN - 1402018371 SP - 251 EP - 258 ER - TY - CHAP A1 - Land, Ingmar A1 - Hoeher, Peter Adam A1 - Gligorevic, Snjezana T1 - Computation of symbol-wise mutual information in transmission systems with logAPP decoders and application to EXIT charts T2 - 5th International ITG Conference on Source and Channel Coding (SCC) : January 14 - 16, 2004, Erlangen ; conference record. (ITG-Fachbericht ; 181) Y1 - 2004 SN - 3-8007-2802-8 SP - 195 EP - 202 PB - VDE-Verl. CY - Berlin [u.a.] ER - TY - CHAP A1 - Detert, T. A1 - Gligorevic, Snjezana A1 - Haak, W. A1 - Sorger, Ulrich T1 - Maximum-likelihood channel estimation using the spreading matrix in fast time-variant frequency selective channels T2 - Proceedings of the 3rd IEEE International Symposium on Signal Processing and Information Technology, ISSPIT 2003 : 14 - 17 December 2003, Darmstadt, Germany Y1 - 2003 SN - 0-7803-8292-7 SP - 347 EP - 350 ER - TY - CHAP A1 - Ritz, Thomas T1 - Production and distribution of personalized information services employing mass customization T2 - 2nd Interdisciplinary World Congress on Mass Customization and Personalization : MCPC'03, October 6 - 8, 2003, Technische Universität München, Munic, Germany Y1 - 2003 SP - Part IV PB - Techn. Univ. (TUM) CY - München ET - CD-Ausg. ER -