TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 42 (1993), H. 2 Y1 - 1993 SN - 0018-9456 SP - 528 EP - 531 ER - TY - JOUR A1 - Heuermann, Holger A1 - Stolle, Reinhard A1 - Schiek, Burkhard T1 - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B. Y1 - 1995 N1 - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference; NTC <1995, Orlando, Fla.> SP - 129 EP - 132 ER - TY - JOUR A1 - Heuermann, Holger T1 - Praezise Streuparametermessungen sind der Schluessel zur Modellierung elektrischer Schaltungen JF - Neues von Rohde & Schwarz (1997) Y1 - 1997 SP - 22 EP - 23 ER - TY - BOOK A1 - Heuermann, Holger T1 - Sichere Verfahren zur Kalibrierung von Netzwerkanalysatoren fuer koaxiale und planare Leitungssysteme Y1 - 1996 SN - 3-8265-1495-5 N1 - Zugl.: Bochum, Univ., Diss., 1995 PB - Shaker CY - Aachen ER - TY - BOOK A1 - Heuermann, Holger T1 - Hochfrequenztechnik : Lineare Komponenten hochintegrierter Hochfrequenzschaltungen Y1 - 2005 SN - 3-528-03980-9 PB - Vieweg CY - Wiesbaden ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1 Y1 - 1994 SN - 0018-9456 SP - 18 EP - 23 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Error corrected impedance measurements with a network analyzer JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2 Y1 - 1995 SN - 0018-9456 SP - 295 EP - 299 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1120 EP - 1127 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - 15-term self-calibration methods for the error-correction of on-wafer measurements JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1105 EP - 1110 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Line Network Network (LNN): an alternative in-fixture calibration procedure JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3 Y1 - 1997 SN - 0018-9480 SP - 408 EP - 413 ER -