TY  - JOUR
A1  - Reißel, Martin
A1  - Bitsch, G.
A1  - Stamm, H.
T1  - A Stern Door Slam Fatigue Calculation / Bitsch, G. ; Reißel, M. ; Stamm, H.
JF  - Proceedings of the 18. CAD-FEM Users Meeting
Y1  - 2000
ER  - 
TY  - BOOK
A1  - Laack, Walter van
T1  - Nobody ever dies! / 1. ed.
Y1  - 2000
SN  - 978-3-936624-03-8
PB  - van Laack
CY  - Aachen
ER  - 
TY  - JOUR
A1  - Poghossian, Arshak
A1  - Yoshinobu, T.
A1  - Simonis, A.
A1  - Ecken, H.
A1  - Lüth, H.
A1  - Schöning, Michael Josef
T1  - Penicillin detection by means of field-effect based sensors: EnFET, capacitive EIS sensor or LAPS?
JF  - Proceedings : Copenhagen, Denmark, 27 - 30 August 2000 / [ed.: R. de Reus ...]
Y1  - 2000
SN  - 87-89935-50-0
N1  - Eurosensors ; (14, 2000, København) ; Eurosensors ; (14 : ; 2000.08.27-30 : ; Copenhagen) ; European Conference on Solid-State Transducers ; (14 : ; 2000.08.27-30 : ; Copenhagen)
SP  - 27
EP  - 30
PB  - MIC, Mikroelektronik Centret
CY  - Lyngby, Denmark
ER  - 
TY  - JOUR
A1  - Poghossian, Arshak
A1  - Thust, M.
A1  - Schöning, Michael Josef
A1  - Müller-Veggian, Mattea
A1  - Kordos, P.
A1  - Lüth, H.
T1  - Cross-sensitivity of a capacitive penicillin sensor combined with a diffusion barrier
JF  - Sensors and Actuators B. 68 (2000), H. 1-3
Y1  - 2000
SN  - 0925-4005
SP  - 260
EP  - 265
ER  - 
TY  - BOOK
A1  - Laack, Walter van
T1  - Key to Eternity / Walter van Laack. [Transl. by Anneliese Wolstenholme]
Y1  - 2000
SN  - 978-3-8311-0344-7
N1  - Schlüssel zur Ewigkeit <engl.>
PB  - van Laack
CY  - Aachen
ER  - 
TY  - BOOK
A1  - Staat, Manfred
A1  - Heitzer, M.
A1  - Yan, Ai-Min
A1  - Khoi, Vu Duc
A1  - Nguyen, Dang Hung
A1  - Valdoire, F.
A1  - Lahousse, A.
T1  - Limit Analysis of Defects
Y1  - 2000
SN  - 0944-2952
N1  - Bericht des Forschungszentrums, Jül-3746, Jülich (2000)
PB  - Forschungszentrum Jülich
CY  - Jülich
ER  - 
TY  - JOUR
A1  - Staat, Manfred
A1  - Heitzer, M.
T1  - Reliability Analysis of Elasto-Plastic Structures under Variable Loads
JF  - Inelastic analysis of structures under variable loads : theory and engineering applications / Maier, G.; Weichert, D. [ed]
Y1  - 2000
SN  - 0-7923-6645-X
SP  - 269
EP  - 288
PB  - Kluwer Academic Publ.
CY  - Dordrecht
ER  -