TY - JOUR A1 - Hagemann, Hans-Jürgen A1 - Hennings, D. A1 - Wernicke, R. T1 - Ceramic multilayer capacitors. Hagemann, H. J.; Hennings, D.; Wernicke, R. JF - Philips' technical review / Philips' Gloeilampenfabrieken. Philips' Gloeilampenfabrieken . 41 (1984) Y1 - 1984 SN - 0031-7926 SP - 89 EP - 98 ER - TY - JOUR A1 - Hagemann, Hans-Jürgen A1 - Stumpe, R. A1 - Wagner, D. A1 - Bäuerle, D. T1 - The influence of contact effects on the dielectric behavior of diffuse phase transitions. Stumpe, R.; Wagner, D.; Bäuerle, D.; Hagemann, H. J. JF - Ferroelectrics : the international journal devoted to the theoretical, experimental, and applied aspects of ferroelectrics and related materials / Letters section. 4 (1985) Y1 - 1985 SN - 0731-5171 SP - 143 EP - 147 ER - TY - JOUR A1 - Hagemann, Hans-Jürgen A1 - Geittner, P. A1 - Warnier, J. A1 - Weling, F. T1 - Reduction of geometric taper losses in the PCVD process. Geittner, P.; Hagemann, H. J.; Warnier, J.; Weling, F.; Wilson, H. JF - Electronics letters : an intern. publication / The Institution of Electrical Engineers. 21 (1985), H. 13 Y1 - 1985 SN - 0013-5194 SP - 870 EP - 871 ER - TY - JOUR A1 - Hagemann, Hans-Jürgen A1 - Geittner, P. A1 - Leers, D. T1 - Intrinsic scattering and absorption losses of Ge- and F-doped optical fibres prepared by PCVD. Geittner, P.; Hagemann, H. J. ; Leers, D. JF - Electronics letters : an intern. publication / The Institution of Electrical Engineers. 25 (1989), H. 7 Y1 - 1989 SN - 0013-5194 SP - 436 EP - 437 ER - TY - JOUR A1 - Hagemann, Hans-Jürgen A1 - Geittner, P. A1 - Warnier, J. A1 - Wilson, H. T1 - PCVD at high deposition rates. Geittner, P.; Hagemann, H. J.; Warnier, J.; Wilson, H. JF - Journal of Lightwave Technology (J-LT) / Institute of Electrical and Electronics Engineers (IEEE). 4 (1986), H. 7 Y1 - 1986 SN - 0733-8724 SP - 818 EP - 822 ER - TY - JOUR A1 - Mühl, Thomas A1 - Binnebösel, Marcel A1 - Klinge, Uwe A1 - Goedderz, Thomas T1 - New objective measurement to characterize the porosity of textile implants JF - Journal of Biomedical Materials Research Part B: Applied Biomaterials. 84B (2008), H. 1 Y1 - 2008 SN - 1552-4981 SP - 176 EP - 183 ER - TY - JOUR A1 - Prume, Klaus A1 - Franken, Klaus A1 - Maier, Horst R. A1 - Waser, Rainer T1 - Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer JF - Journal of the American Ceramic Society. 83 (2000), H. 6 Y1 - 2000 SN - 0002-7820 SP - 1433 EP - 1440 ER - TY - JOUR A1 - Prume, Klaus A1 - Waser, Rainer A1 - Franken, Klaus A1 - Maier, Horst R. T1 - Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ; JF - Journal of the American Ceramic Society. 83 (2000), H. 5 Y1 - 2000 SN - 0002-7820 SP - 1153 EP - 1159 ER - TY - JOUR A1 - Prume, Klaus A1 - Reichenberg, B. A1 - Roelofs, A. A1 - Waser, R. T1 - In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S. JF - Journal of the European Ceramic Society. 24 (2004), H. 6 Y1 - 2004 SN - 0955-2219 N1 - Electroceramics VIII SP - 1145 EP - 1147 ER - TY - JOUR A1 - Prume, Klaus A1 - Franken, Klaus A1 - Böttger, Ulrich A1 - Waser, Rainer T1 - Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R. JF - Journal of the European Ceramic Society. 22 (2002), H. 8 Y1 - 2002 SN - 0955-2219 SP - 1285 EP - 1296 ER - TY - JOUR A1 - Prume, Klaus A1 - Roelofs, Andreas A1 - Schmitz, Thorsten A1 - Reichenberg, Bernd T1 - Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb JF - Japanese Journal of Applied Physics. 41 (2002), H. 11B Y1 - 2002 SN - 0021-4922 SP - 7198 EP - 7201 ER - TY - JOUR A1 - Prume, Klaus A1 - Meyer, René A1 - Waser, Rainer A1 - Schmitz, Torsten T1 - Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, René ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan JF - Applied Physics Letters . 86 (2005), H. 14 Y1 - 2005 SN - 0003-6951 SP - 142907-1 EP - 142907-3 ER - TY - JOUR A1 - Prume, Klaus A1 - Muralt, Paul A1 - Calame, Florian A1 - Schmitz-Kempen, Thorsten T1 - Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan JF - Journal of Electroceramics. 19 (2007), H. 4 Y1 - 2007 SN - 1385-3449 SP - 407 EP - 411 ER - TY - JOUR A1 - Prume, Klaus A1 - Booij, W. E. A1 - Vogl, A. H. A1 - Wang, D. T. T1 - A simple and powerful analytical model for MEMS piezoelectric multimorphs / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K. JF - Journal of Electroceramics. 19 (2007), H. 4 Y1 - 2007 SN - 1385-3449 SP - 387 EP - 393 ER - TY - JOUR A1 - Prume, Klaus A1 - Tyholdt, F. A1 - Calame, F. A1 - Raeder, H. T1 - Chemically derived seeding layer for {100}-textured PZT thin films / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P. JF - Journal of Electroceramics. 19 (2007), H. 4 Y1 - 2007 SN - 1385-3449 SP - 311 EP - 314 ER - TY - JOUR A1 - Prume, Klaus A1 - Raeder, H. A1 - Tyholdt, F. A1 - Booij, W. E. T1 - Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P. JF - Journal of Electroceramics. 19 (2007), H. 4 Y1 - 2007 SN - 1385-3449 SP - 357 EP - 362 ER - TY - JOUR A1 - Prume, Klaus A1 - Peter, F. A1 - Rüdiger, A. A1 - Dittmann, R. T1 - Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; Rüdiger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ; JF - Applied Physics Letters . 87 (2005), H. 8 Y1 - 2005 SN - 0003-6951 SP - 082901 EP - 082901-3 ER - TY - JOUR A1 - Prume, Klaus A1 - Gerber, Peter A1 - Kügeler, Carsten A1 - Roelofs, Andreas T1 - Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen, Y1 - 2004 SN - 0-7803-8410-5 N1 - 14th IEEE International Symposium on Applications of Ferroelectrics, 2004. ISAF-04. 2004 SP - 7 EP - 10 ER - TY - JOUR A1 - Prume, Klaus A1 - Tiedke, S. A1 - Schmitz, T. A1 - Roelofs, A. T1 - Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs JF - Applied Physics Letters. 79 (2001), H. 22 Y1 - 2001 SN - 0003-6951 SP - 3678 EP - 3680 ER - TY - JOUR A1 - Prume, Klaus A1 - Gerber, P. A1 - Roelofs, A. A1 - Kügeler, C. T1 - Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.; Böttger, U. ; Waser, R. ; Prume, K. ; JF - Journal of Applied Physics . 96 (2004), H. 5 Y1 - 2004 SN - 0021-8979 SP - 2800 EP - 2804 ER -