TY  - JOUR
A1  - Ritz, Thomas
T1  - Information Channels
JF  - Information Technology. Nr. 52 (2000), H. 08. Mai 2000
Y1  - 2000
SP  - 15
EP  - 15
ER  - 
TY  - JOUR
A1  - Hagemann, Hans-Jürgen
A1  - Breitschuh, S.
A1  - Graber, S.
A1  - Schmitz, Günter
T1  - Internet Laboratory Courses with Remote Access and Control of Real Measurements on Sensors and Electronic Components
JF  - Mechatronics & Robotics 2004 : Aachen, Germany, September 13 - 15, 2004 / [APS - European Centre for Mechatronics]. P. Drews (ed.)
Y1  - 2004
SN  - 3-938153-30-X
N1  - MechRob <2004, Aachen>
SP  - 1280
EP  - 1284
PB  - Eysoldt
CY  - Aachen
ER  - 
TY  - JOUR
A1  - Hagemann, Hans-Jürgen
A1  - Bachmann, P. K.
A1  - Lade, H.
A1  - Leers, D.
T1  - Thermal properties of C/H-, C/H/O-, C/H/N- and C/H/X-grown polycrystalline CVD diamond. P. K. Bachmann, H. J. Hagemann, H. Lade,  ...
JF  - Diamond and Related Material. Vol 4. (1995), H. Issue 5-6
Y1  - 1995
N1  - <a href="http://dx.doi.org/10.1016/0925-9635(94)05229-8">abstract online:</a>
SP  - 820
EP  - 826
PB  - Elsevier Science
CY  - New York, NY [u.a.]
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Stolle, Reinhard
A1  - Schiek, Burkhard
T1  - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B.
Y1  - 1995
N1  - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference;  NTC <1995, Orlando, Fla.>
SP  - 129
EP  - 132
ER  - 
TY  - CHAP
A1  - Ritz, Thomas
T1  - Production and distribution of personalized information services employing mass customization
T2  - 2nd Interdisciplinary World Congress on Mass Customization and Personalization : MCPC'03, October 6 - 8, 2003, Technische Universität München, Munic, Germany
Y1  - 2003
SP  - Part IV
PB  - Techn. Univ. (TUM)
CY  - München
ET  - CD-Ausg.
ER  - 
TY  - CHAP
A1  - Stender, Michael
A1  - Ritz, Thomas
T1  - Modeling of business-to-business mobile commerce processes
T2  - Electronic proceedings / ICPR 17, 17th International Conference on Production Research [Blacksburg, Virginia, USA, August 3 - 7, 2003]
Y1  - 2003
SN  - 0-9721257-3-6
CY  - Blacksburg, Va.
ET  - CD-ROM-Ausg.
ER  - 
TY  - JOUR
A1  - Krause, Gregor
A1  - Fruth, B.
T1  - Dielectric Properties of Polyolefins Stressed by High Electrical Fields / Fruth, B. ; Krause, G.
JF  - Plenary lectures and contributions presented at the International Symposium on Polymer Materials : held in San Sebastian (Donostia), Spain, 31 August - 4 September, 1987 / symposium ed. G. M. Guzmán ; A. Santamaria
Y1  - 1988
SN  - 3-85739-220-7
N1  - International Symposium on Polymer Materials <1987, San Sebastián, Golfo de Vizcaya>
PB  - Huethig & Wepf
CY  - Basel
ER  - 
TY  - JOUR
A1  - Krause, Gregor
A1  - Schuppe, W.D.
A1  - Saure, M.
A1  - Andress, H.
T1  - Sensitive Analytical and Physical Methods for Diagnosis of Variations in Polyolefin Plaques and Cable Insulations / W.D. Schuppe, M. Saure, H. Andress, K. Möller, D. Meurer, G. Krause
JF  - Proceedings of the 32nd session : 28th August - 3rd September.
Y1  - 1988
N1  - International Conference on Large Electric Systems, CIGRÉ <32, Paris, 1988>
ER  - 
TY  - JOUR
A1  - Krause, Gregor
A1  - Meurer, D.
A1  - Klee, D.
T1  - Space Charge Formation Related to the Morphology of Polymers
JF  - ISE 6 : 6th International symposium on electrets : Papers
Y1  - 1988
N1  - International Symposium on Electrets <6, 1988, Oxford>
PB  - IEEE
CY  - Piscataway, NY
ER  - 
TY  - JOUR
A1  - Krause, Gregor
A1  - Möller, K.
A1  - Meurer, D.
T1  - Dielectric phenomena in semicrystalline polymers
JF  - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 2
Y1  - 1989
N1  - Digital Object Identifier 10.1109/14.90276
SP  - 215
EP  - 222
ER  - 
TY  - JOUR
A1  - Krause, Gregor
A1  - Meurer, D.
A1  - Klee, D.
T1  - Space charge formation related to the morphology of polymers
JF  - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 3
Y1  - 1989
N1  - Digital Object Identifier 10.1109/14.30883
SP  - 215
EP  - 222
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1
Y1  - 1994
SN  - 0018-9456
SP  - 18
EP  - 23
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Error corrected impedance measurements with a network analyzer
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2
Y1  - 1995
SN  - 0018-9456
SP  - 295
EP  - 299
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1120
EP  - 1127
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, B.
T1  - 15-term self-calibration methods for the error-correction of on-wafer measurements
JF  - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5
Y1  - 1997
SN  - 0018-9456
SP  - 1105
EP  - 1110
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Line Network Network (LNN): an alternative in-fixture calibration procedure
JF  - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3
Y1  - 1997
SN  - 0018-9480
SP  - 408
EP  - 413
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
T1  - Calibration procedures with series impedances and unknown lines simplify on-wafer measurements
JF  - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1
Y1  - 1999
SN  - 0018-9480
SP  - 1
EP  - 5
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Calibration of network analyser measurements with leakage errors
JF  - Electronics letters. 30 (1994), H. 1
Y1  - 1994
SN  - 0013-5194
SP  - 52
EP  - 53
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - Error Corrected Impedance Measurements with a Network Analyzer
Y1  - 1994
N1  - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese
SP  - 125
EP  - 126
ER  - 
TY  - JOUR
A1  - Heuermann, Holger
A1  - Schiek, Burkhard
T1  - A Generalization of the Txx Network Analyzer Self-Calibration Procedure
JF  - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2
Y1  - 1992
SN  - 0-946821-77-1
N1  - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu <Helsinki>
SP  - 907
EP  - 912
PB  - Microwave Exhibitions and Publishers
CY  - Tunbridge Wells
ER  -