TY  - JOUR
A1  - Kloock, Joachim P.
A1  - Poghossian, Arshak
A1  - Schumacher, K.
A1  - Rosenkranz, C.
A1  - Schultze, J. W.
A1  - Müller-Veggian, Mattea
A1  - Schöning, Michael Josef
T1  - Funktionsprüfung und Charakterisierung von ionensensitiven Feldeffekttransistoren (ISFETs) auf Waferebene mittels Mikrotropfenzelle für den zukünftigen Einsatz in der Sensorproduktion
JF  - Sensoren und Messsysteme 2006 : Vorträge der 13. ITG/GMA-Fachtagung vom 13. bis 14. März 2006 in Freiburg/Breisgau / Veranst.: Informationstechnische Gesellschaft im VDE (ITG) ; VDE/VDI-Gesellschaft Mess- und Automatisierungstechnik (GMA). Wiss. Tagungsleitung: L. M. Reindl
Y1  - 2006
SN  - 3-8007-2939-3
N1  - Fachtagung Sensoren und Messsysteme <13, 2006, Freiburg, Breisgau>
SP  - 257
EP  - 260
PB  - VDE-Verl.
CY  - Berlin
ER  - 
TY  - CHAP
A1  - Schöning, Michael Josef
A1  - Abouzar, Maryam H.
A1  - Han, Y.
A1  - Ingebrandt, S.
A1  - Offenhäusser, A.
A1  - Poghossian, Arshak
T1  - Markierungsfreie DNA-Detektion mit Silizium-Feldeffektsensoren – Messeffekte oder Artefakte?
T2  - Sensoren und Mess-Systeme 2006 : Vorträge der 13. ITG/GMA-Fachtagung vom 13. bis 14.3.2006 in Freiburg/Breisgau
Y1  - 2006
SN  - 3-8007-2939-3
SP  - 443
EP  - 446
PB  - VDE Verl.
CY  - Berlin
ER  - 
TY  - CHAP
A1  - Poghossian, Arshak
A1  - Schumacher, Kerstin
A1  - Kloock, Joachim P.
A1  - Rosenkranz, Christian
A1  - Schultze, Joachim W.
A1  - Müller-Veggian, Mattea
A1  - Schöning, Michael Josef
T1  - Functional testing and characterisation of ISFETs on wafer level by means of a micro-droplet cell
N2  - A wafer-level functionality testing and characterisation system for ISFETs (ionsensitive field-effect transistor) is realised by means of integration of a specifically designed capillary electrochemical micro-droplet cell into a commercial wafer prober-station. The developed system allows the identification and selection of “good” ISFETs at the earliest stage and to avoid expensive bonding, encapsulation and packaging processes for nonfunctioning ISFETs and thus, to decrease costs, which are wasted for bad dies. The developed system is also feasible for wafer-level characterisation of ISFETs in terms of sensitivity, hysteresis and response time. Additionally, the system might be also utilised for wafer-level testing of further electrochemical sensors.
KW  - Biosensor
KW  - Biosensorik
KW  - ISFET
KW  - Wafer
KW  - ISFET
KW  - wafer-level testing
KW  - capillary micro-droplet cell
Y1  - 2006
U6  - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:hbz:a96-opus-1259
ER  - 
TY  - CHAP
A1  - Poghossian, Arshak
A1  - Schöning, Michael Josef
T1  - Silicon-based chemical and biological field-effect sensors
T2  - Encyclopedia of Sensors. Vol. 9 S - Sk
Y1  - 2006
SN  - 1-58883-065-9
SP  - 463
EP  - 534
PB  - ASP, American Scientific Publ.
CY  - Stevenson Ranch, Calif.
ER  - 
TY  - CHAP
A1  - Poghossian, Arshak
A1  - Ingebrandt, S.
A1  - Platen, J.
A1  - Schöning, Michael Josef
T1  - Field-effect sensors with charged macromolecules – from micro towards nano aspects
T2  - Biochemical Sensing Utilisation of Micro-and                       Nanotechnologies, Warschau, Nov. 2005 : Lecture Notes of the                       ICB Seminar / ed.: M. Mascini, W. Torbicz
Y1  - 2006
SP  - 74
EP  - 81
PB  - Polish Academy Sciences Press
CY  - Warsaw
ER  - 
TY  - JOUR
A1  - Bialonski, Stephan
A1  - Lehnertz, Klaus
T1  - Identifying phase synchronization clusters in spatially extended dynamical systems
JF  - Physical Review E
Y1  - 2006
U6  - https://doi.org/10.1103/PhysRevE.74.051909
SN  - 2470-0053
VL  - 74
IS  - 5
SP  - 051909
ER  - 
TY  - CHAP
A1  - Moreno, Lia
A1  - Dosev, D.
A1  - Bratov, A.
A1  - Dominguez, C.
A1  - Schöning, Michael Josef
A1  - Kloock, Joachim P.
T1  - Effect of electrical properties of the surrounding medium on the response of an interdigitated electrode array with chalcogenide glass film
T2  - XX Eurosensors : 20th anniversary ; Göteborg, Sweden, 17 - 20 September 2006 ; [proceedings]. - Vol. 1
Y1  - 2006
SN  - 978-91-631-9280-7
N1  - Paper number: T1A-P22
SP  - 384
EP  - 385
CY  - Göteborg
ER  -