TY - JOUR A1 - Krause, Gregor A1 - Fruth, B. T1 - Dielectric Properties of Polyolefins Stressed by High Electrical Fields / Fruth, B. ; Krause, G. JF - Plenary lectures and contributions presented at the International Symposium on Polymer Materials : held in San Sebastian (Donostia), Spain, 31 August - 4 September, 1987 / symposium ed. G. M. Guzmán ; A. Santamaria Y1 - 1988 SN - 3-85739-220-7 N1 - International Symposium on Polymer Materials <1987, San Sebastián, Golfo de Vizcaya> PB - Huethig & Wepf CY - Basel ER - TY - JOUR A1 - Grundmann, Reinhard A1 - Bommes, Leonhard T1 - Analyse von Kennfeldern drallgesteuerter Radialventilatoren JF - HLH - Zeitschrift für Heizung, Lüftung, Klimatechnik, Haustechnik. 55 (2004), H. 8 Y1 - 2004 SN - 0017-9906 SP - 54 EP - 62 ER - TY - JOUR A1 - Krause, Gregor A1 - Schuppe, W.D. A1 - Saure, M. A1 - Andress, H. T1 - Sensitive Analytical and Physical Methods for Diagnosis of Variations in Polyolefin Plaques and Cable Insulations / W.D. Schuppe, M. Saure, H. Andress, K. Möller, D. Meurer, G. Krause JF - Proceedings of the 32nd session : 28th August - 3rd September. Y1 - 1988 N1 - International Conference on Large Electric Systems, CIGRÉ <32, Paris, 1988> ER - TY - JOUR A1 - Krause, Gregor A1 - Meurer, D. A1 - Klee, D. T1 - Space Charge Formation Related to the Morphology of Polymers JF - ISE 6 : 6th International symposium on electrets : Papers Y1 - 1988 N1 - International Symposium on Electrets <6, 1988, Oxford> PB - IEEE CY - Piscataway, NY ER - TY - BOOK A1 - Grundmann, Reinhard A1 - Schönholtz, Friedrich T1 - „Ventilatoren-Fibel“ der Firma Babcock-BSH Y1 - 1999 N1 - Neuauflage überarbeitet und ergänzt von Herbert Eidam und Bernd Rahn PB - Promotor-Verlag CY - Karlsruhe ER - TY - JOUR A1 - Krause, Gregor A1 - Fruth, Bernhard A1 - Krause, Gregor A1 - Meurer, D. T1 - Einfluß der Verarbeitungsverfahren und verarbeitungsbedingter Werkstoffzusätze auf die dielektrischen Eigenschaften von Kunststoffen / B. Fruth, G. Krause, D. Meurer, K. Möller Y1 - 1988 N1 - Ergebnisbericht 1986-87-88 Sonderforschungsbereich 106 RWTH Aachen: "Korrelation von Fertigung und Bauteileeigenschaften bei Kunststoffen" CY - Aachen ER - TY - JOUR A1 - Krause, Gregor A1 - Möller, K. A1 - Meurer, D. T1 - Dielectric phenomena in semicrystalline polymers JF - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 2 Y1 - 1989 N1 - Digital Object Identifier 10.1109/14.90276 SP - 215 EP - 222 ER - TY - JOUR A1 - Krause, Gregor A1 - Meurer, D. A1 - Klee, D. T1 - Space charge formation related to the morphology of polymers JF - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 3 Y1 - 1989 N1 - Digital Object Identifier 10.1109/14.30883 SP - 215 EP - 222 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1 Y1 - 1994 SN - 0018-9456 SP - 18 EP - 23 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Error corrected impedance measurements with a network analyzer JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2 Y1 - 1995 SN - 0018-9456 SP - 295 EP - 299 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1120 EP - 1127 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - 15-term self-calibration methods for the error-correction of on-wafer measurements JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1105 EP - 1110 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Line Network Network (LNN): an alternative in-fixture calibration procedure JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3 Y1 - 1997 SN - 0018-9480 SP - 408 EP - 413 ER - TY - JOUR A1 - Heuermann, Holger T1 - Calibration procedures with series impedances and unknown lines simplify on-wafer measurements JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1 Y1 - 1999 SN - 0018-9480 SP - 1 EP - 5 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Calibration of network analyser measurements with leakage errors JF - Electronics letters. 30 (1994), H. 1 Y1 - 1994 SN - 0013-5194 SP - 52 EP - 53 ER - TY - JOUR A1 - Heuermann, Holger T1 - Leerläufe als postulierte Kalibrierstandards fuer Messungen auf planaren Schaltungen JF - tm - Technisches Messen. 64. 1997 (1997), H. 6 Y1 - 1997 SP - 230 EP - 237 ER - TY - JOUR A1 - Heuermann, Holger A1 - Stolle, Reinhard A1 - Schiek, Burkhard T1 - Auswertemethoden zur Praezisions-Entfernungsmessung mit FMCW-Systemen und deren Anwendung im Mikrowellenbereich JF - tm - Technisches Messen. 62. 1995 (1995), H. 2 Y1 - 1995 SP - 66 EP - 73 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Robuster Algorithmus zur Streuparameterbestimmung für systemfehlerkorrigierte Netzwerkanalysatoren JF - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 35. 1991 (1991) Y1 - 1991 SP - 555 EP - 556 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Error Corrected Impedance Measurements with a Network Analyzer Y1 - 1994 N1 - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese SP - 125 EP - 126 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - A Generalization of the Txx Network Analyzer Self-Calibration Procedure JF - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2 Y1 - 1992 SN - 0-946821-77-1 N1 - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu SP - 907 EP - 912 PB - Microwave Exhibitions and Publishers CY - Tunbridge Wells ER -