TY - JOUR A1 - Hagemann, Hans-Jürgen A1 - Breitschuh, S. A1 - Graber, S. A1 - Schmitz, Günter T1 - Internet Laboratory Courses with Remote Access and Control of Real Measurements on Sensors and Electronic Components JF - Mechatronics & Robotics 2004 : Aachen, Germany, September 13 - 15, 2004 / [APS - European Centre for Mechatronics]. P. Drews (ed.) Y1 - 2004 SN - 3-938153-30-X N1 - MechRob <2004, Aachen> SP - 1280 EP - 1284 PB - Eysoldt CY - Aachen ER - TY - JOUR A1 - Hagemann, Hans-Jürgen A1 - Bachmann, P. K. A1 - Lade, H. A1 - Leers, D. T1 - Thermal properties of C/H-, C/H/O-, C/H/N- and C/H/X-grown polycrystalline CVD diamond. P. K. Bachmann, H. J. Hagemann, H. Lade, ... JF - Diamond and Related Material. Vol 4. (1995), H. Issue 5-6 Y1 - 1995 N1 - abstract online: SP - 820 EP - 826 PB - Elsevier Science CY - New York, NY [u.a.] ER - TY - JOUR A1 - Heuermann, Holger A1 - Stolle, Reinhard A1 - Schiek, Burkhard T1 - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B. Y1 - 1995 N1 - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference; NTC <1995, Orlando, Fla.> SP - 129 EP - 132 ER - TY - JOUR A1 - Heuermann, Holger T1 - Praezise Streuparametermessungen sind der Schluessel zur Modellierung elektrischer Schaltungen JF - Neues von Rohde & Schwarz (1997) Y1 - 1997 SP - 22 EP - 23 ER - TY - JOUR A1 - Ritz, Thomas A1 - Stender, Michael ED - Weisbecker, Anette T1 - Ad-hoc Anwendungsintegration mit mobilen CRM-Systement JF - Electronic Business : Innovationen, Anwendungen und Technologien Y1 - 2004 SN - 3-8167-6621-8 SP - 92 EP - 97 PB - Fraunhofer-IRB-Verl. CY - Stuttgart ER - TY - JOUR A1 - Ritz, Thomas A1 - Benz, Axel ED - Spath, Dieter T1 - Informationserfassung im Außendienst JF - CRM-Systeme in produzierenden Unternehmen. - (IAO-Forum : mit Anwenderberichten) Y1 - 2004 N1 - Fraunhofer IAO Forum 31. März 2004 VL - 2004 PB - IRB-Verl. CY - Stuttgart ER - TY - JOUR A1 - Ritz, Thomas T1 - Mobile CRM-Systeme : Customer Relationship Management zur Unterstützung des Vertriebsaußendienstes JF - Zeitschrift für wirtschaftlichen Fabrikbetrieb : ZWF ; Organ des VDI-Kompetenzfeldes Informationstechnik (VDI-KfIT) Y1 - 2003 SN - 0932-0482 (Print) SN - 0947-0085 (Online) VL - 99 IS - 12 SP - 699 EP - 702 ER - TY - JOUR A1 - Krause, Gregor A1 - Fruth, B. T1 - Dielectric Properties of Polyolefins Stressed by High Electrical Fields / Fruth, B. ; Krause, G. JF - Plenary lectures and contributions presented at the International Symposium on Polymer Materials : held in San Sebastian (Donostia), Spain, 31 August - 4 September, 1987 / symposium ed. G. M. Guzmán ; A. Santamaria Y1 - 1988 SN - 3-85739-220-7 N1 - International Symposium on Polymer Materials <1987, San Sebastián, Golfo de Vizcaya> PB - Huethig & Wepf CY - Basel ER - TY - JOUR A1 - Krause, Gregor A1 - Schuppe, W.D. A1 - Saure, M. A1 - Andress, H. T1 - Sensitive Analytical and Physical Methods for Diagnosis of Variations in Polyolefin Plaques and Cable Insulations / W.D. Schuppe, M. Saure, H. Andress, K. Möller, D. Meurer, G. Krause JF - Proceedings of the 32nd session : 28th August - 3rd September. Y1 - 1988 N1 - International Conference on Large Electric Systems, CIGRÉ <32, Paris, 1988> ER - TY - JOUR A1 - Krause, Gregor A1 - Meurer, D. A1 - Klee, D. T1 - Space Charge Formation Related to the Morphology of Polymers JF - ISE 6 : 6th International symposium on electrets : Papers Y1 - 1988 N1 - International Symposium on Electrets <6, 1988, Oxford> PB - IEEE CY - Piscataway, NY ER - TY - JOUR A1 - Krause, Gregor A1 - Fruth, Bernhard A1 - Krause, Gregor A1 - Meurer, D. T1 - Einfluß der Verarbeitungsverfahren und verarbeitungsbedingter Werkstoffzusätze auf die dielektrischen Eigenschaften von Kunststoffen / B. Fruth, G. Krause, D. Meurer, K. Möller Y1 - 1988 N1 - Ergebnisbericht 1986-87-88 Sonderforschungsbereich 106 RWTH Aachen: "Korrelation von Fertigung und Bauteileeigenschaften bei Kunststoffen" CY - Aachen ER - TY - JOUR A1 - Krause, Gregor A1 - Möller, K. A1 - Meurer, D. T1 - Dielectric phenomena in semicrystalline polymers JF - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 2 Y1 - 1989 N1 - Digital Object Identifier 10.1109/14.90276 SP - 215 EP - 222 ER - TY - JOUR A1 - Krause, Gregor A1 - Meurer, D. A1 - Klee, D. T1 - Space charge formation related to the morphology of polymers JF - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 3 Y1 - 1989 N1 - Digital Object Identifier 10.1109/14.30883 SP - 215 EP - 222 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1 Y1 - 1994 SN - 0018-9456 SP - 18 EP - 23 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Error corrected impedance measurements with a network analyzer JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2 Y1 - 1995 SN - 0018-9456 SP - 295 EP - 299 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1120 EP - 1127 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - 15-term self-calibration methods for the error-correction of on-wafer measurements JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1105 EP - 1110 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Line Network Network (LNN): an alternative in-fixture calibration procedure JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3 Y1 - 1997 SN - 0018-9480 SP - 408 EP - 413 ER - TY - JOUR A1 - Heuermann, Holger T1 - Calibration procedures with series impedances and unknown lines simplify on-wafer measurements JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1 Y1 - 1999 SN - 0018-9480 SP - 1 EP - 5 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Calibration of network analyser measurements with leakage errors JF - Electronics letters. 30 (1994), H. 1 Y1 - 1994 SN - 0013-5194 SP - 52 EP - 53 ER -