TY - JOUR A1 - Heuermann, Holger A1 - Stolle, Reinhard A1 - Schiek, Burkhard T1 - Novel Algorithms for FMCW Range Finding with Microwaves. Stolle, R.; Heuermann, H.; Schiek, B. Y1 - 1995 N1 - Conference proceedings / IEEE NTC '95, the Microwave Systems Conference; NTC <1995, Orlando, Fla.> SP - 129 EP - 132 ER - TY - CHAP A1 - Ritz, Thomas T1 - Production and distribution of personalized information services employing mass customization T2 - 2nd Interdisciplinary World Congress on Mass Customization and Personalization : MCPC'03, October 6 - 8, 2003, Technische Universität München, Munic, Germany Y1 - 2003 SP - Part IV PB - Techn. Univ. (TUM) CY - München ET - CD-Ausg. ER - TY - CHAP A1 - Stender, Michael A1 - Ritz, Thomas T1 - Modeling of business-to-business mobile commerce processes T2 - Electronic proceedings / ICPR 17, 17th International Conference on Production Research [Blacksburg, Virginia, USA, August 3 - 7, 2003] Y1 - 2003 SN - 0-9721257-3-6 CY - Blacksburg, Va. ET - CD-ROM-Ausg. ER - TY - JOUR A1 - Krause, Gregor A1 - Fruth, B. T1 - Dielectric Properties of Polyolefins Stressed by High Electrical Fields / Fruth, B. ; Krause, G. JF - Plenary lectures and contributions presented at the International Symposium on Polymer Materials : held in San Sebastian (Donostia), Spain, 31 August - 4 September, 1987 / symposium ed. G. M. Guzmán ; A. Santamaria Y1 - 1988 SN - 3-85739-220-7 N1 - International Symposium on Polymer Materials <1987, San Sebastián, Golfo de Vizcaya> PB - Huethig & Wepf CY - Basel ER - TY - JOUR A1 - Krause, Gregor A1 - Schuppe, W.D. A1 - Saure, M. A1 - Andress, H. T1 - Sensitive Analytical and Physical Methods for Diagnosis of Variations in Polyolefin Plaques and Cable Insulations / W.D. Schuppe, M. Saure, H. Andress, K. Möller, D. Meurer, G. Krause JF - Proceedings of the 32nd session : 28th August - 3rd September. Y1 - 1988 N1 - International Conference on Large Electric Systems, CIGRÉ <32, Paris, 1988> ER - TY - JOUR A1 - Krause, Gregor A1 - Meurer, D. A1 - Klee, D. T1 - Space Charge Formation Related to the Morphology of Polymers JF - ISE 6 : 6th International symposium on electrets : Papers Y1 - 1988 N1 - International Symposium on Electrets <6, 1988, Oxford> PB - IEEE CY - Piscataway, NY ER - TY - JOUR A1 - Krause, Gregor A1 - Möller, K. A1 - Meurer, D. T1 - Dielectric phenomena in semicrystalline polymers JF - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 2 Y1 - 1989 N1 - Digital Object Identifier 10.1109/14.90276 SP - 215 EP - 222 ER - TY - JOUR A1 - Krause, Gregor A1 - Meurer, D. A1 - Klee, D. T1 - Space charge formation related to the morphology of polymers JF - IEEE Transaction on Electrical Insulation. Vol. 24 (1989), H. No. 3 Y1 - 1989 N1 - Digital Object Identifier 10.1109/14.30883 SP - 215 EP - 222 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1 Y1 - 1994 SN - 0018-9456 SP - 18 EP - 23 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Error corrected impedance measurements with a network analyzer JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 44 (1995), H. 2 Y1 - 1995 SN - 0018-9456 SP - 295 EP - 299 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1120 EP - 1127 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - 15-term self-calibration methods for the error-correction of on-wafer measurements JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 46 (1997), H. 5 Y1 - 1997 SN - 0018-9456 SP - 1105 EP - 1110 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Line Network Network (LNN): an alternative in-fixture calibration procedure JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 45 (1997), H. 3 Y1 - 1997 SN - 0018-9480 SP - 408 EP - 413 ER - TY - JOUR A1 - Heuermann, Holger T1 - Calibration procedures with series impedances and unknown lines simplify on-wafer measurements JF - IEEE transactions on microwave theory and techniques : MTT ; a publication of the IEEE Microwave Theory and Techniques Society. 47 (1999), H. 1 Y1 - 1999 SN - 0018-9480 SP - 1 EP - 5 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Calibration of network analyser measurements with leakage errors JF - Electronics letters. 30 (1994), H. 1 Y1 - 1994 SN - 0013-5194 SP - 52 EP - 53 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Error Corrected Impedance Measurements with a Network Analyzer Y1 - 1994 N1 - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese SP - 125 EP - 126 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - A Generalization of the Txx Network Analyzer Self-Calibration Procedure JF - Conference proceedings : monday 24th to thursday 27th august 1992, Helsinki University of Technology, Espoo, Finland ; [the international conference and exhibition designed for the Microwave Community]. Vol. 2 Y1 - 1992 SN - 0-946821-77-1 N1 - European Microwave Conference <22, 1992, Espoo> ; Teknillinen Korkeakoulu SP - 907 EP - 912 PB - Microwave Exhibitions and Publishers CY - Tunbridge Wells ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - The In-Fixture Calibration Procedure Line-Network-Network-LNN JF - Conference proceedings : monday 6th to thursday 9th september 1993, Palacio de Congresos, Madrid, Spain ; [the international conference and exhibition designed for the Microwave Community] Y1 - 1992 SN - 0-946821-23-2 N1 - European Microwave Conference <23, 1993, Madrid> SP - 500 EP - 505 PB - Reed Exhibition Companies CY - Tunbridge Wells ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique JF - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994] Y1 - 1994 SN - 0-9518032-5-5 N1 - European Microwave Conference <24, 1994, Cannes> PB - Nexus Business Communications CY - Swanley ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - The double-LNN Calibration technique for scattering parameter measurements of microstrip devices JF - Conference proceedings Y1 - 1995 N1 - European Microwave Conference <25, 1995, Bologna> SP - 343 EP - 347 PB - NEXUS House CY - Kent ER -