TY - JOUR A1 - Grüters, Hugo T1 - Berechnung des Spannungszustandes in homogenen Scheiben aus anisotrop-elastischem Material JF - Zeitschrift für angewandte Mathematik und Mechanik : ZAMM Y1 - 1972 SN - 0044-2267 U6 - https://doi.org/10.1002/zamm.19720521105 VL - 52 IS - 11 SP - T127 EP - T128 PB - Wiley-VCH CY - Weinheim ER - TY - JOUR A1 - Grüters, Hugo A1 - Blank, K. T1 - Contribution to the size effect on the strength of flat glass. Blank, K.; Grüters, H. JF - Glastechnische Berichte. 63 (1990), H. 5 Y1 - 1990 SN - 0017-1085 SP - 135 EP - 140 ER - TY - JOUR A1 - Grüters, Hugo A1 - Blank, K. A1 - Dürkop, D. A1 - Durchholz, M. T1 - Strength tests of flat glass by means of four-point bending. Blank, K.; Dürkop, D.; Durchholz, M.; Grüters, H. JF - Glastechnische Berichte. Glass science and technology. 67 (1994), H. 1 Y1 - 1994 SN - 0946-7475 SP - 9 EP - 15 ER - TY - JOUR A1 - Grüters, Hugo A1 - Gitschner, H.-W. T1 - Diffusionsbedingte Eigenspannungen (Quellspannungen) und Deformationszustände in anisotropen glasfaserverstärkten Mehrschichten-Verbundwerkstoffen. Gitschner, H.-W.; Grüters, H. JF - Kunststoffe. 71 (1981), H. 3 Y1 - 1981 SN - 0023-5563 SP - 178 EP - 183 ER - TY - JOUR A1 - Grüters, Hugo A1 - Hackl, K. A1 - Willms, H. T1 - Stress and strain analyses of rectangular glass plates for large deformations. Part 2. Calculation of fracture probabilities in rectangular plates under area load JF - Glastechnische Berichte. 63 (1990), H. 4 Y1 - 1990 SN - 0017-1085 SP - 93 EP - 95 ER - TY - JOUR A1 - Grüters, Hugo A1 - Hackl, K. A1 - Willms, H. T1 - Stress and strain analyses of rectangular glass plates for large deformations. Part 1. Dimensioning of rectangular plates under surface load and/or line load. JF - Glastechnische Berichte. 63 (1990), H. 3 Y1 - 1990 SN - 0017-1085 SP - 69 EP - 77 ER - TY - JOUR A1 - Grüters, Hugo A1 - Hiemenz, C. T1 - Berechnung des Verzugs und der Schwindung von PUR-Strukturschaumplatten JF - Kunststoffe. 70 (1980), H. 4 Y1 - 1980 SN - 0023-5563 SP - 228 EP - 233 ER - TY - JOUR A1 - Grüters, Hugo A1 - Hiemenz, C. T1 - Berechnung des Verzugs und der Schwindung von Profilen aus PUR-Strukturschaumstoff. Kriterien zur Herstellung von verzugsfreien Profilen JF - Kunststoffe. 70 (1980), H. 2 Y1 - 1980 SN - 0023-5563 SP - 102 EP - 107 ER - TY - JOUR A1 - Grüters, Hugo A1 - Müller, C. H. T1 - Experimentell-rechnerische Ermittlung von Eigenspannungen JF - Zeitschrift für angewandte Mathematik und Mechanik : ZAMM = Journal of applied mathematics and mechanics. 59 (1979) Y1 - 1979 SN - 0044-2267 SP - T184 EP - T186 ER - TY - JOUR A1 - Grüters, Hugo A1 - Müller, C. H. T1 - Anwendung der Cosseratschen Kontinuumstheorie auf den ebenen Verbundkörper JF - Zeitschrift für angewandte Mathematik und Mechanik : ZAMM. 61 (1981) Y1 - 1981 SN - 0044-2267 SP - T92 EP - T94 ER - TY - JOUR A1 - Grüters, Hugo A1 - Müller, C. H. A1 - Willms, H. T1 - Ein Beitrag zur Berechnung von Gusseigenspannungen in Rohren JF - Zeitschrift für angewandte Mathematik und Mechanik : ZAMM = Journal of applied mathematics and mechanics. 63 (1983) Y1 - 1983 SN - 0044-2267 SP - T160 EP - T163 ER - TY - JOUR A1 - Grüters, Hugo A1 - Müller, Carl Harald T1 - Zur Berechnung der Schubspannungen in Klebverbindungen JF - Automobil-Industrie. 25 (1980), H. 2 Y1 - 1980 SN - 0005-1306 SP - 65 EP - 67 ER - TY - BOOK A1 - Grüters, Hugo A1 - Peters, Norbert T1 - Mechanik. Bd. 2 Dynamik. Peters, Norbert; Grüters, Hugo Y1 - 1984 PB - Inst. für Techn. Mechanik, RWTH Aachen CY - Aachen ER - TY - BOOK A1 - Grüters, Hugo A1 - Peters, Norbert T1 - Mechanik. Bd. 1 Statik, Festigkeitslehre / N. Peters, H. Grüters Y1 - 1982 PB - Inst. für Techn. Mechanik, RWTH Aachen CY - Aachen ER - TY - JOUR A1 - Grüters, Hugo A1 - Savvidis, E. A1 - Löer, F. A1 - Wiesener, C. H. T1 - Analyse der Beanspruchung des proximalen Femur bei verschiedenen Arten der Belastung mit Hilfe der Finite-Element-Methode / Savvidis, E. ; Löer, F. ; Grüters, Hugo ; Wiesener, C. H. JF - Zeitschrift für Orthopädie und ihre Grenzgebiete. 129 (1991), H. 3 Y1 - 1991 SN - 1615-9586 SP - 268 EP - 277 ER - TY - JOUR A1 - Grüters, Hugo A1 - Senger, W. T1 - Simulation des biomechanisch durch Energiedehnung stimulierten Knochenumbaus JF - Biomedizinische Technik. 57 (1992), H. Ergänzungsband 1 Y1 - 1992 SN - 0013-5585 SP - 39 EP - 41 ER - TY - JOUR A1 - Gun, Jenny A1 - Gutkin, Vitaly A1 - Lev, Ovadia A1 - Boyen, Hans-Gerd A1 - Saitner, Marc A1 - Wagner, Patrick A1 - Olieslaeger, Marc D´ A1 - Abouzar, Maryam H. A1 - Poghossian, Arshak A1 - Schöning, Michael Josef T1 - Tracing gold nanoparticle charge by electrolyte-insulator-semiconductor devices JF - Journal of Physical Chemistry C. 115 (2011), H. 11 Y1 - 2011 SN - 1932-7455 SP - 4439 EP - 4445 PB - American Cemical Society CY - Washington, DC ER - TY - JOUR A1 - Gun, Jenny A1 - Rizkov, Dan A1 - Lev, Ovadia A1 - Abouzar, Maryam H. A1 - Poghossian, Arshak A1 - Schöning, Michael Josef T1 - Oxygen plasma-treated gold nanoparticle-based field-effect devices as transducer structures for bio-chemical sensing JF - Microchimica Acta. 164 (2008), H. 3-4 Y1 - 2008 SN - 1436-5073 SP - 395 EP - 404 ER - TY - JOUR A1 - Gun, Jenny A1 - Schöning, Michael Josef A1 - Abouzar, Maryam H. A1 - Poghossian, Arshak A1 - Katz, Evgeny T1 - Field-Effect Nanoparticle-Based Glucose Sensor on a Chip: Amplification Effect of Coimmobilized Redox Species JF - Electroanalysis. 20 (2008), H. 16 Y1 - 2008 SN - 1521-4109 SP - 1748 EP - 1753 ER - TY - JOUR A1 - Guo, Yuanyuan A1 - Miyamoto, Ko-ichiro A1 - Wagner, Torsten A1 - Schöning, Michael Josef A1 - Yoshinobu, Tatsuo T1 - Device simulation of the light-addressable potentiometric sensor for the investigation of the spatial resolution JF - Sensors and actuators B: Chemical N2 - As a semiconductor-based electrochemical sensor, the light-addressable potentiometric sensor (LAPS) can realize two dimensional visualization of (bio-)chemical reactions at the sensor surface addressed by localized illumination. Thanks to this imaging capability, various applications in biochemical and biomedical fields are expected, for which the spatial resolution is critically significant. In this study, therefore, the spatial resolution of the LAPS was investigated in detail based on the device simulation. By calculating the spatiotemporal change of the distributions of electrons and holes inside the semiconductor layer in response to a modulated illumination, the photocurrent response as well as the spatial resolution was obtained as a function of various parameters such as the thickness of the Si substrate, the doping concentration, the wavelength and the intensity of illumination. The simulation results verified that both thinning the semiconductor substrate and increasing the doping concentration could improve the spatial resolution, which were in good agreement with known experimental results and theoretical analysis. More importantly, new findings of interests were also obtained. As for the dependence on the wavelength of illumination, it was found that the known dependence was not always the case. When the Si substrate was thick, a longer wavelength resulted in a higher spatial resolution which was known by experiments. When the Si substrate was thin, however, a longer wavelength of light resulted in a lower spatial resolution. This finding was explained as an effect of raised concentration of carriers, which reduced the thickness of the space charge region. The device simulation was found to be helpful to understand the relationship between the spatial resolution and device parameters, to understand the physics behind it, and to optimize the device structure and measurement conditions for realizing higher performance of chemical imaging systems. Y1 - 2014 U6 - https://doi.org/10.1016/j.snb.2014.08.016 SN - 1873-3077 (E-Journal); 0925-4005 (Print) VL - 204 SP - 659 EP - 665 PB - Elsevier CY - Amsterdam ER -