TY - JOUR A1 - Mühl, Thomas T1 - Berechnung von Lichtintensitätsverteilungen in streuenden Medien Y1 - 1988 N1 - Aachen, Techn. Hochsch., Diss., 1988 ER - TY - JOUR A1 - Starke, Günther T1 - Auftragsbezogene Fertigung beim Schutzgasschweissen mit Robotern durch Einsatz flexibler Fertigungssysteme JF - DVS-Berichte. 118 (1988) Y1 - 1988 SN - 0418-9639 N1 - Konferenz-Einzelbericht SP - 27 EP - 31 ER - TY - JOUR A1 - Förster, Arnold A1 - Schäfer, B.-J. A1 - Londschien, M. T1 - Arsenic passivation of MOMBE grown GaAs surfaces / B. -J. Schäfer ; A. Förster ; M. Londschien ... JF - Surface Science. 204 (1988), H. 3 Y1 - 1988 SN - 0039-6028 N1 - ISSN der E-Ausg.: 0039-6028 SP - 485 EP - 490 ER - TY - JOUR A1 - Schmitz, Günter A1 - Spicher, U. A1 - Kollmeier, H.P. T1 - Application of a New Optical-Fiber Technique for Flame Propagation Diagnostics in IC Engines Y1 - 1988 N1 - SAE- Paper-No.: 881637, 1988 SAE International Fuels and Lubricants Meeting and Exposition, Portland, October 10-13, 1988 ER - TY - JOUR A1 - Stulpe, Werner A1 - Gudder, S. A1 - Hagler, J. T1 - An Uncertainty Relation for Joint Position-Momentum Measurements JF - Foundations of Physics Letters. 1 (1988), H. 3 Y1 - 1988 SN - 1572-9524 SP - 287 EP - 292 ER - TY - JOUR A1 - Hoyler, Friedrich A1 - Petkov, P. A1 - Andrejtscheff, W. T1 - Absolute E0, E1 and E2 transition rates in even-even nuclei obtained in thermal neutron capture / P. Petkov ; W. Andrejtscheff ... F. Hoyler ... JF - Journal of Physics G. 14 (1988), H. S Y1 - 1988 SN - 0305-4616 SP - S97 EP - S102 ER - TY - JOUR A1 - Hillen, Walter A1 - Schiebel, U. A1 - Zaengel, T. T1 - A selenium-based detector for digital slot-radiography JF - Medical Imaging II Y1 - 1988 N1 - Proceedings of SPIE ; 914 SP - 253 ER - TY - JOUR A1 - Ziemons, Karl T1 - A measurement of the spin asymmetry of the structure function g1 in deep inelastic muon-proton scattering JF - Physics Letters B N2 - The spin asymmetry in deep inelastic scattering of longitudinally polarised muons by longitudinally polarised protons has been measured over a large x range (0.01