TY - JOUR A1 - Schäfer, Horst A1 - Boege, P. A1 - Shanjia, Xu A1 - Xinzhang, Wu (u.a.) T1 - Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method JF - Conference digest : 10 - 14 January 1994, San Diego, California / International Conference on Millimeter and Submillimeter Waves and Applications / Mohammed N. Afsar, chair/ed. Y1 - 1994 SN - 0-8194-1558-8 N1 - Serie Proceedings / SPIE, The International Society for Optical Engineering ; 2250 SP - 649 EP - 658 PB - SPIE CY - Bellingham, Wash. ER - TY - JOUR A1 - Schulte-Zurhausen, Manfred A1 - Poznanska, K. T1 - Kryteria klasyfikacji malych i srednich przedsiebiorstw = Kriterien zur Klassifizierung von kleinen und mittleren Unternehmen JF - Przeglad Organizacji (1994) Y1 - 1994 SP - 24 EP - 27 ER - TY - JOUR A1 - Schmitz, Günter A1 - Oligschläger, U. A1 - Eifler, G. A1 - Lechner, H. T1 - Automated System for Optimized Calibration of Engine Management Systems Y1 - 1994 N1 - SAE International Congress and Exposition, Detroit, Feb. 28 - March 3 ; SAE- Paper-No.: 940151 ;