TY - JOUR A1 - Benkner, Thorsten T1 - Investigation of mobile antenna diagrams on cochannel interference JF - Proceedings / Organization: IEEE Vehicular Technology/Communications Society; Joint Chapter in the Benelux Section. Ed.: L. Vandendorpe Y1 - 1994 N1 - Symposium on Communications and Vehicular Technology in the Benelux ; (2, 1994, Louvain-la-Neuve) ; Vehicular Technology Society ; Communications Society ; Institute of Electrical and Electronics Engineers. ; Benelux ; IEEE Symposium on Communications and PB - Univ. Catholoque de Louvain CY - Loovain ER - TY - JOUR A1 - Benkner, Thorsten T1 - Full Adaptive Channel Assignment Schemes for PRMA++ Cellular Mobile Radio Systems Y1 - 1994 N1 - IEEE Workshop on Mobility Management for Personal Communications. George Mason University, Fairfax, Virginia, USA, 8.-9. September 1994 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, B. T1 - Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures JF - IEEE transactions on instrumentation and measurement : IM / Institute of Electrical and Electronics Engineers, Instrumentation and Measurement Group. 43 (1994), H. 1 Y1 - 1994 SN - 0018-9456 SP - 18 EP - 23 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Calibration of network analyser measurements with leakage errors JF - Electronics letters. 30 (1994), H. 1 Y1 - 1994 SN - 0013-5194 SP - 52 EP - 53 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Sichere on-wafer-Streuparameter-Messungen mit Selbstkalibrierverfahren JF - Kleinheubacher Berichte : Vorträge und Berichte der gemeinsamen Tagung des U.R.S.I.-Landesausschusses in der Bundesrepublik Deutschland / Hrsg.: Deutsche Telekom AG. 38. 1994 (1994) Y1 - 1994 SP - 611 EP - 622 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Error Corrected Impedance Measurements with a Network Analyzer Y1 - 1994 N1 - 1994 Conference on Precision Electromagnetic Measurements digest : 27 June - 1 July 1994, Boulder, Colorado, USA / Organized by National Institute of Standards and Technology. Ed. by Edie DeWeese SP - 125 EP - 126 ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique JF - Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994] Y1 - 1994 SN - 0-9518032-5-5 N1 - European Microwave Conference <24, 1994, Cannes> PB - Nexus Business Communications CY - Swanley ER - TY - JOUR A1 - Heuermann, Holger A1 - Schiek, Burkhard T1 - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure Y1 - 1994 N1 - 1994 IEEE MTT-S International Microwave Symposium digest : May 23 - 27, 1994, San Diego Convention Center, San Diego, California / H. J. Kuno, ed. SP - 1361 EP - 1364 ER - TY - JOUR A1 - Heuermann, Holger A1 - Baumann, F.-M. A1 - Fauth, G. A1 - Albert, M. T1 - Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure JF - On-Line Moisture Analysis of Raw Coal Y1 - 1994 N1 - 1993 International Symposium on On-Line Analysis of Coal : Vienna ; [proceedings]. SP - 1361 EP - 1364 ER - TY - JOUR A1 - Hagemann, Hans-Jürgen A1 - Bachmann, P.K. A1 - Lade, H. A1 - Leers, D. T1 - CVD Diamond Growth: Gas Compositions and Film Properties / P.K. Bachmann, H.J. Hagemann, H. Lade, D. Leers, D.U. Wiechert and H. Wilson JF - Advanced materials '94 : proceedings of the NIRIM International Symposium on Advanced Materials '94, Tsukuba, Japan, March 13 - 17, 1994 / National Institute for Research in Inorganic Materials. Ed. by M. Kamo ... Y1 - 1994 N1 - NIRIM International Symposium on Advanced Materials ; 1994 (Tsukuba) : 1994.03.13-17 SP - 115 EP - 120 PB - International Communications Specialists CY - Tokyo ER -