Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. Förster ...

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Author:Arnold Förster, A. Rosenauer, T. Remmele
Parent Title (English):Microscopy of semiconducting materials 1997 : proceedings of the Royal Microscopical Society Conference held at Oxford University, 7 - 10 April 1997 / ed. by A. G. Cullis ... - (Conference series / Institute of Physics ; 157)
Publisher:Institute of Physics
Place of publication:Bristol [u.a.]
Document Type:Article
Year of Completion:1997
Date of the Publication (Server):2012/12/18
Length:XVI, 709 S. : Ill., graph. Darst.
First Page:39
Last Page:ff.
MSM <10, 1997, Oxford> ; Conference on Microscopy of Semiconducting Materials <10, 1997, Oxford> ; Institut of Physics <London>
Institutes:FH Aachen / Fachbereich Energietechnik