Strain determination in mismatched semiconductor heterostructures by the digital analysis of lattice images / A. Rosenauer ; T. Remmele ; U. Fischer ; A. Förster ...
| Author: | Arnold Förster, A. Rosenauer, T. Remmele |
|---|---|
| ISBN: | 0-7503-0464-2 |
| Parent Title (English): | Microscopy of semiconducting materials 1997 : proceedings of the Royal Microscopical Society Conference held at Oxford University, 7 - 10 April 1997 / ed. by A. G. Cullis ... - (Conference series / Institute of Physics ; 157) |
| Publisher: | Institute of Physics |
| Place of publication: | Bristol [u.a.] |
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 1997 |
| Date of the Publication (Server): | 2012/12/18 |
| Length: | XVI, 709 S. : Ill., graph. Darst. |
| First Page: | 39 |
| Last Page: | ff. |
| Note: | MSM <10, 1997, Oxford> ; Conference on Microscopy of Semiconducting Materials <10, 1997, Oxford> ; Institut of Physics <London> |
| Institutes: | FH Aachen / Fachbereich Energietechnik |
