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Safety of subjects during radiofrequency exposure in ultra-high-field magnetic resonance imaging

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Author:Thomas M. Fiedler, Mark E. Ladd, Markus Clemens, Andreas Bitz
Parent Title (English):IEEE Letters on Electromagnetic Compatibility Practice and Applications
Document Type:Article
Year of Completion:2020
Date of the Publication (Server):2020/10/19
Issue:Early Access
First Page:1
Last Page:8
Institutes:FH Aachen / Fachbereich Elektrotechnik und Informationstechnik