Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor
Author: | Ko-ichiro Miyamoto, Yu Bing, Torsten WagnerORCiD, Tatsuo Yoshinobu, Michael Josef SchöningORCiD |
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DOI: | https://doi.org/10.1016/j.proeng.2015.08.806 |
ISSN: | 1877-7058 |
Parent Title (English): | Procedia Engineering |
Publisher: | Elsevier |
Place of publication: | Amsterdam |
Document Type: | Article |
Language: | English |
Year of Completion: | 2015 |
Date of the Publication (Server): | 2015/10/01 |
Volume: | 120 |
First Page: | 936 |
Last Page: | 939 |
Institutes: | FH Aachen / Fachbereich Medizintechnik und Technomathematik |
FH Aachen / INB - Institut für Nano- und Biotechnologien | |
collections: | Verlag / Elsevier |