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Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor

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Metadaten
Author:Ko-ichiro Miyamoto, Yu Bing, Torsten WagnerORCiD, Tatsuo Yoshinobu, Michael Josef SchöningORCiD
DOI:https://doi.org/10.1016/j.proeng.2015.08.806
ISSN:1877-7058
Parent Title (English):Procedia Engineering
Publisher:Elsevier
Place of publication:Amsterdam
Document Type:Article
Language:English
Year of Completion:2015
Date of the Publication (Server):2015/10/01
Volume:120
First Page:936
Last Page:939
Institutes:FH Aachen / Fachbereich Medizintechnik und Technomathematik
FH Aachen / INB - Institut für Nano- und Biotechnologien
collections:Verlag / Elsevier