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Visualization of the recovery process of defects in a cultured cell layer by chemical imaging sensor

  • The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel cell assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the recovery of defects in a cell layer brought into proximity of the sensing surface. A reduced impedance at a defect formed artificially in a cell layer was successfully visualized in a photocurrent image. The cell layer was cultured over two weeks, during which the temporal change of the photocurrent distribution corresponding to the recovery of the defect was observed.

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Metadaten
Author:Ko-ichiro Miyamoto, Bing Yu, Hiroko Isoda, Torsten WagnerORCiD, Michael Josef SchöningORCiD, Tatsuo Yoshinobu
DOI:https://doi.org/10.1016/j.snb.2016.04.018
ISSN:0925-4005
Parent Title (German):Sensors and Actuators B: Chemical
Publisher:Elsevier
Place of publication:Amsterdam
Document Type:Article
Language:German
Year of Completion:2016
Date of the Publication (Server):2016/04/18
Volume:236
First Page:965
Last Page:969
Link:https://doi.org/10.1016/j.snb.2016.04.018
Zugriffsart:bezahl
Institutes:FH Aachen / Fachbereich Medizintechnik und Technomathematik
FH Aachen / INB - Institut für Nano- und Biotechnologien
collections:Verlag / Elsevier