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Annealing characteristics of native defects in low-temperature-grown MBE GaAs / J. Darmo ; F. Dubecky ; P. Kordos ; A. Förster

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Metadaten
Author:Arnold Förster, J. Darmo, F. Dubecký, P. Kordos
ISBN:0-7803-3095-1
Parent Title (English):Semiconducting and insulating materials 1996 : proceedings of the 9th Conference on Semiconducting and Insulating Materials (SIMC '9), April 29 - May 3, 1996, Toulouse, France / [IEEE]
Place of publication:Piscataway, NJ [u.a.]
Document Type:Article
Language:English
Year of Completion:1996
Date of the Publication (Server):2012/12/18
Length:XVII, 379 S. : Ill., graph. Darst.
First Page:67
Last Page:ff.
Note:
2. ISBN: 0-7803-3179-6 ; Conference on Semiconducting and Insulating Materials <9, 1996, Toulouse> ; Institute of Electrical and Electronics Engineers ; IEEE Cat. No.96CH35881
Institutes:FH Aachen / Fachbereich Energietechnik